共 50 条
Origin of perpendicular magnetic anisotropy in Co/Ni multilayers
被引:40
|作者:
Arora, M.
[1
]
Huebner, R.
[2
]
Suess, D.
[3
]
Heinrich, B.
[1
]
Girt, E.
[1
]
机构:
[1] Simon Fraser Univ, Dept Phys, Burnaby, BC V5A 1S6, Canada
[2] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Dresden, Germany
[3] Univ Vienna, Fac Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, A-1090 Vienna, Austria
基金:
加拿大自然科学与工程研究理事会;
关键词:
FERROMAGNETIC-RESONANCE;
SURFACE ANISOTROPY;
INTERFACE STRUCTURE;
NANOPILLARS;
COBALT;
FILMS;
D O I:
10.1103/PhysRevB.96.024401
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We studied the variation in perpendicular magnetic anisotropy of (111) textured Au/N x [Co/Ni]/Au films as a function of the number of bilayer repeats N. The ferromagnetic resonance and superconducting quantum interference device magnetometer measurements show that the perpendicular magnetic anisotropy of Co/Ni multilayers first increases with N for N <= 10 and then moderately decreases for N > 10. The model we propose reveals that the decrease of the anisotropy for N < 10 is predominantly due to the reduction in the magnetoelastic and magnetocrystalline anisotropies. A moderate decrease in the perpendicular magnetic anisotropy for N > 10 is due to the reduction in the magnetocrystalline and the surface anisotropies. To calculate the contribution of magnetoelastic anisotropy in the Co/Ni multilayers, in-plane and out-of-plane x-ray diffraction measurements are performed to determine the spacing between Co/Ni (111) and (220) planes. The magnetocrystalline bulk anisotropy is estimated from the difference in the perpendicular and parallel g factors of Co/Ni multilayers that are measured using the in-plane and out-of-plane ferromagnetic resonance measurements. Transmission electron microscopy has been used to estimate the multilayer film roughness. These values are used to calculate the roughness-induced surface and magnetocrystalline anisotropy coefficients as a function of N.
引用
收藏
页数:13
相关论文