Origin of perpendicular magnetic anisotropy in Co/Ni multilayers

被引:40
|
作者
Arora, M. [1 ]
Huebner, R. [2 ]
Suess, D. [3 ]
Heinrich, B. [1 ]
Girt, E. [1 ]
机构
[1] Simon Fraser Univ, Dept Phys, Burnaby, BC V5A 1S6, Canada
[2] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Dresden, Germany
[3] Univ Vienna, Fac Phys, Christian Doppler Lab Adv Magnet Sensing & Mat, A-1090 Vienna, Austria
基金
加拿大自然科学与工程研究理事会;
关键词
FERROMAGNETIC-RESONANCE; SURFACE ANISOTROPY; INTERFACE STRUCTURE; NANOPILLARS; COBALT; FILMS;
D O I
10.1103/PhysRevB.96.024401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We studied the variation in perpendicular magnetic anisotropy of (111) textured Au/N x [Co/Ni]/Au films as a function of the number of bilayer repeats N. The ferromagnetic resonance and superconducting quantum interference device magnetometer measurements show that the perpendicular magnetic anisotropy of Co/Ni multilayers first increases with N for N <= 10 and then moderately decreases for N > 10. The model we propose reveals that the decrease of the anisotropy for N < 10 is predominantly due to the reduction in the magnetoelastic and magnetocrystalline anisotropies. A moderate decrease in the perpendicular magnetic anisotropy for N > 10 is due to the reduction in the magnetocrystalline and the surface anisotropies. To calculate the contribution of magnetoelastic anisotropy in the Co/Ni multilayers, in-plane and out-of-plane x-ray diffraction measurements are performed to determine the spacing between Co/Ni (111) and (220) planes. The magnetocrystalline bulk anisotropy is estimated from the difference in the perpendicular and parallel g factors of Co/Ni multilayers that are measured using the in-plane and out-of-plane ferromagnetic resonance measurements. Transmission electron microscopy has been used to estimate the multilayer film roughness. These values are used to calculate the roughness-induced surface and magnetocrystalline anisotropy coefficients as a function of N.
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页数:13
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