High resolution reflection tomographic diffractive microscopy

被引：24

作者：

Sarmis, M. ^{[1
]}

Simon, B. ^{[1
]}

Debailleul, M. ^{[1
]}

Colicchio, B. ^{[1
]}

Georges, V. ^{[1
]}

Delaunay, J. -J. ^{[2
]}

Haeberle, O. ^{[1
]}

机构：

[1] Univ Haute Alsace, Lab MIPS EA2332, IUT Mulhouse, F-68093 Mulhouse, France

[2] Univ Tokyo, Sch Engn, Dept Mech Engn, Bunkyo Ku, Tokyo 1138656, Japan

来源：

JOURNAL OF MODERN OPTICS | 2010年 / 57卷 / 09期

关键词：

tomographic diffractive microscopy; Fourier optics; holographic interferometry; resolution; RECONSTRUCTION; SCATTERING; HOLOGRAMS; SAMPLES;

D O I：

10.1080/09500341003624743

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed a tomographic diffractive microscope in reflection, using a high numerical aperture objective and equipped with a fluorescence confocal scanner. We describe the set-up and first images of a microscopic USAF target, obtained in holographic, diffractive tomographic, and confocal mode, and which reveal the higher resolution capabilities of this instrument. We also compare images obtained in transmission and in reflection, emphasizing the better optical sectioning capabilities of reflection diffractive tomographic microscopy.

引用

页码：740 / 745

页数：6

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