Use of a charge-coupled device detector in the 120-190 nm range in axially-viewed inductively coupled plasma atomic emission spectrometry

An ICP-AES system equipped with a UV-enhanced charge coupled device detector was evaluated in terms of limits of detection in the range 120-190 nm. LODs were compared to those obtained from the most sensitive lines above 190 nm and to those from previously published work based on the use of a photomultiplier tube. Elements can be classified into three groups: elements with lines that are only sensitive below 165 nm such as Cl and Br, elements with lines that are more sensitive than the lines commonly used above 165 nm, such as Ga, Ge and In, and elements with lines that can be an efficient alternative to the most sensitive lines because of possible spectral interferences such as B, Bi, Pb and Sn. Preliminary investigations indicated that the Cl intensity is dependent on the anion.