共 24 条
[1]
[Anonymous], IEDM
[2]
Si- and Sn-Doped Homoepitaxial β-Ga2O3 Layers Grown by MOVPE on (010)-Oriented Substrates
[J].
Baldini, Michele
;
Albrecht, Martin
;
Fiedler, Andreas
;
Irmscher, Klaus
;
Schewski, Robert
;
Wagner, Guenter
.
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY,
2017, 6 (02)
:Q3040-Q3044

Baldini, Michele
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany

论文数: 引用数:
h-index:
机构:

论文数: 引用数:
h-index:
机构:

论文数: 引用数:
h-index:
机构:

Schewski, Robert
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany

Wagner, Guenter
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany Leibniz Inst Crystal Growth IKZ, D-12489 Berlin, Germany
[3]
Recessed-Gate Enhancement-Mode β-Ga2O3 MOSFETs
[J].
Chabak, Kelson D.
;
McCandless, Jonathan P.
;
Moser, Neil A.
;
Green, Andrew J.
;
Mahalingam, Krishnamurthy
;
Crespo, Antonio
;
Hendricks, Nolan
;
Howe, Brandon M.
;
Tetlak, Stephen E.
;
Leedy, Kevin
;
Fitch, Robert C.
;
Wakimoto, Daiki
;
Sasaki, Kohei
;
Kuramata, Akito
;
Jessen, Gregg H.
.
IEEE ELECTRON DEVICE LETTERS,
2018, 39 (01)
:67-70

Chabak, Kelson D.
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

McCandless, Jonathan P.
论文数: 0 引用数: 0
h-index: 0
机构:
KBRWyle, Beavercreek, OH 45440 USA
Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14853 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Moser, Neil A.
论文数: 0 引用数: 0
h-index: 0
机构:
George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Green, Andrew J.
论文数: 0 引用数: 0
h-index: 0
机构:
KBRWyle, Beavercreek, OH 45440 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Mahalingam, Krishnamurthy
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Crespo, Antonio
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Hendricks, Nolan
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Howe, Brandon M.
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Tetlak, Stephen E.
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Leedy, Kevin
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Fitch, Robert C.
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Wakimoto, Daiki
论文数: 0 引用数: 0
h-index: 0
机构:
Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan
Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Sasaki, Kohei
论文数: 0 引用数: 0
h-index: 0
机构:
Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan
Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Kuramata, Akito
论文数: 0 引用数: 0
h-index: 0
机构:
Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan
Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA

Jessen, Gregg H.
论文数: 0 引用数: 0
h-index: 0
机构:
US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
[4]
Enhancement-mode Ga2O3 wrap-gate fin field-effect transistors on native (100) β-Ga2O3 substrate with high breakdown voltage
[J].
Chabak, Kelson D.
;
Moser, Neil
;
Green, Andrew J.
;
Walker, Dennis E.
;
Tetlak, Stephen E.
;
Heller, Eric
;
Crespo, Antonio
;
Fitch, Robert
;
McCandless, Jonathan P.
;
Leedy, Kevin
;
Baldini, Michele
;
Wagner, Gunter
;
Galazka, Zbigniew
;
Li, Xiuling
;
Jessen, Gregg
.
APPLIED PHYSICS LETTERS,
2016, 109 (21)

Chabak, Kelson D.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Univ Illinois, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Urbana, IL 61801 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Moser, Neil
论文数: 0 引用数: 0
h-index: 0
机构:
George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Green, Andrew J.
论文数: 0 引用数: 0
h-index: 0
机构:
Wyle Labs Inc, 4200 Colonel Glenn Hwy, Beavercreek, OH 45431 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Walker, Dennis E.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Tetlak, Stephen E.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Heller, Eric
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Crespo, Antonio
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Fitch, Robert
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

McCandless, Jonathan P.
论文数: 0 引用数: 0
h-index: 0
机构:
Wyle Labs Inc, 4200 Colonel Glenn Hwy, Beavercreek, OH 45431 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Leedy, Kevin
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Baldini, Michele
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Wagner, Gunter
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

论文数: 引用数:
h-index:
机构:

Li, Xiuling
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Urbana, IL 61801 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA

Jessen, Gregg
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
[5]
3.8-MV/cm Breakdown Strength of MOVPE-Grown Sn-Doped β-Ga2O3 MOSFETs
[J].
Green, Andrew J.
;
Chabak, Kelson D.
;
Heller, Eric R.
;
Fitch, Robert C., Jr.
;
Baldini, Michele
;
Fiedler, Andreas
;
Irmscher, Klaus
;
Wagner, Guenter
;
Galazka, Zbigniew
;
Tetlak, Stephen E.
;
Crespo, Antonio
;
Leedy, Kevin
;
Jessen, Gregg H.
.
IEEE ELECTRON DEVICE LETTERS,
2016, 37 (07)
:902-905

Green, Andrew J.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA
Wyle Labs, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Chabak, Kelson D.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Heller, Eric R.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Fitch, Robert C., Jr.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Baldini, Michele
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Kristallzuchtung, D-12489 Berlin, Germany Air Force Res Lab, Dayton, OH 45433 USA

论文数: 引用数:
h-index:
机构:

论文数: 引用数:
h-index:
机构:

Wagner, Guenter
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Kristallzuchtung, D-12489 Berlin, Germany Air Force Res Lab, Dayton, OH 45433 USA

论文数: 引用数:
h-index:
机构:

Tetlak, Stephen E.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Crespo, Antonio
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Leedy, Kevin
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA

Jessen, Gregg H.
论文数: 0 引用数: 0
h-index: 0
机构:
Air Force Res Lab, Dayton, OH 45433 USA Air Force Res Lab, Dayton, OH 45433 USA
[6]
State-of-the-art technologies of gallium oxide power devices
[J].
Higashiwaki, Masataka
;
Kuramata, Akito
;
Murakami, Hisashi
;
Kumagai, Yoshinao
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
2017, 50 (33)

Higashiwaki, Masataka
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan

Kuramata, Akito
论文数: 0 引用数: 0
h-index: 0
机构:
Tamura Corp, Sayama, Saitama 3501328, Japan Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan

论文数: 引用数:
h-index:
机构:

Kumagai, Yoshinao
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Univ Agr & Technol, Koganei, Tokyo 1848588, Japan Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan
[7]
Hu Z., 2017, DNA RES INT J RAPID, V25, P1, DOI 10.1109/DRC.2017.7999512
[8]
Near unity ideality factor and Shockley-Read-Hall lifetime in GaN-on-GaN p-n diodes with avalanche breakdown
[J].
Hu, Zongyang
;
Nomoto, Kazuki
;
Song, Bo
;
Zhu, Mingda
;
Qi, Meng
;
Pan, Ming
;
Gao, Xiang
;
Protasenko, Vladimir
;
Jena, Debdeep
;
Xing, Huili Grace
.
APPLIED PHYSICS LETTERS,
2015, 107 (24)

Hu, Zongyang
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Nomoto, Kazuki
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Song, Bo
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Zhu, Mingda
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Qi, Meng
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Pan, Ming
论文数: 0 引用数: 0
h-index: 0
机构:
IQE RF LLC, Somerset, NJ 08873 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Gao, Xiang
论文数: 0 引用数: 0
h-index: 0
机构:
IQE RF LLC, Somerset, NJ 08873 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Protasenko, Vladimir
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Jena, Debdeep
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA
Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA

Xing, Huili Grace
论文数: 0 引用数: 0
h-index: 0
机构:
Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA
Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
[9]
High-voltage field effect transistors with wide-bandgap β-Ga2O3 nanomembranes
[J].
Hwang, Wan Sik
;
Verma, Amit
;
Peelaers, Hartwin
;
Protasenko, Vladimir
;
Rouvimov, Sergei
;
Xing, Huili
;
Seabaugh, Alan
;
Haensch, Wilfried
;
Van de Walle, Chris G.
;
Galazka, Zbigniew
;
Albrecht, Martin
;
Fornari, Roberto
;
Jena, Debdeep
.
APPLIED PHYSICS LETTERS,
2014, 104 (20)

论文数: 引用数:
h-index:
机构:

Verma, Amit
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Peelaers, Hartwin
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Protasenko, Vladimir
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Rouvimov, Sergei
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Xing, Huili
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Seabaugh, Alan
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Haensch, Wilfried
论文数: 0 引用数: 0
h-index: 0
机构:
IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Van de Walle, Chris G.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

论文数: 引用数:
h-index:
机构:

论文数: 引用数:
h-index:
机构:

Fornari, Roberto
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Inst Crystal Growth, D-12489 Berlin, Germany
Univ Parma, Dept Phys & Earth Sci, I-43124 Parma, Italy Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea

Jena, Debdeep
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA Korea Aerosp Univ, Dept Mat Engn, Gyeonggi 412791, South Korea
[10]
1-kV vertical Ga2O3 field-plated Schottky barrier diodes
[J].
Konishi, Keita
;
Goto, Ken
;
Murakami, Hisashi
;
Kumagai, Yoshinao
;
Kuramata, Akito
;
Yamakoshi, Shigenobu
;
Higashiwaki, Masataka
.
APPLIED PHYSICS LETTERS,
2017, 110 (10)

Konishi, Keita
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan

Goto, Ken
论文数: 0 引用数: 0
h-index: 0
机构:
Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan
Tokyo Univ Agr & Technol, Dept Appl Chem, 2-24-16 Naka Cho, Koganei, Tokyo 1848588, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan

论文数: 引用数:
h-index:
机构:

Kumagai, Yoshinao
论文数: 0 引用数: 0
h-index: 0
机构:
Tokyo Univ Agr & Technol, Dept Appl Chem, 2-24-16 Naka Cho, Koganei, Tokyo 1848588, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan

Kuramata, Akito
论文数: 0 引用数: 0
h-index: 0
机构:
Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan

Yamakoshi, Shigenobu
论文数: 0 引用数: 0
h-index: 0
机构:
Tamura Corp, 2-3-1 Hirosedai, Sayama, Saitama 3501328, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan

Higashiwaki, Masataka
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan Natl Inst Informat & Commun Technol, 4-2-1 Nukui Kitamachi, Koganei, Tokyo 1848795, Japan