Enhancement-Mode Ga2O3 Vertical Transistors With Breakdown Voltage > 1 kV

被引:267
作者
Hu, Zongyang [1 ]
Nomoto, Kazuki [1 ]
Li, Wenshen [1 ]
Tanen, Nicholas [2 ]
Sasaki, Kohei [3 ]
Kuramata, Akito [3 ]
Nakamura, Tohru [4 ]
Jena, Debdeep [5 ]
Xing, Huili Grace [5 ]
机构
[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
[2] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[3] Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan
[4] Hosei Univ, Ctr Micronano Technol, Tokyo 1840003, Japan
[5] Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Sch Elect & Comp Engn, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
关键词
beta-Ga2O3; HVPE; breakdown voltage; MISFET; MOSFET; FinFET; enhancement mode; vertical transistor; power electronics;
D O I
10.1109/LED.2018.2830184
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-voltage vertical Ga2O3 MISFETs are developed employing halide vapor phase epitaxial (HVPE) layers on bulk Ga2O3 (001) substrates. The low charge concentration of similar to 10(16) cm(-3) in the n-drift region allows three terminal breakdown voltages to reach up to 1057 V without field plates. The devices operate in the enhancement mode (E-mode) with a threshold voltage of similar to 1.2-2.2V, a current on/off ratio of similar to 108, an on resistance of similar to 13-18m Omega.m(2), and an output current of > 300 A/cm(2). This is the first report of high-voltage vertical Ga2O3 transistors with E-mode operation, a significant milestone toward realizing Ga2O3 based power electronics.
引用
收藏
页码:869 / 872
页数:4
相关论文
共 24 条
[1]  
[Anonymous], IEDM
[2]   Si- and Sn-Doped Homoepitaxial β-Ga2O3 Layers Grown by MOVPE on (010)-Oriented Substrates [J].
Baldini, Michele ;
Albrecht, Martin ;
Fiedler, Andreas ;
Irmscher, Klaus ;
Schewski, Robert ;
Wagner, Guenter .
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2017, 6 (02) :Q3040-Q3044
[3]   Recessed-Gate Enhancement-Mode β-Ga2O3 MOSFETs [J].
Chabak, Kelson D. ;
McCandless, Jonathan P. ;
Moser, Neil A. ;
Green, Andrew J. ;
Mahalingam, Krishnamurthy ;
Crespo, Antonio ;
Hendricks, Nolan ;
Howe, Brandon M. ;
Tetlak, Stephen E. ;
Leedy, Kevin ;
Fitch, Robert C. ;
Wakimoto, Daiki ;
Sasaki, Kohei ;
Kuramata, Akito ;
Jessen, Gregg H. .
IEEE ELECTRON DEVICE LETTERS, 2018, 39 (01) :67-70
[4]   Enhancement-mode Ga2O3 wrap-gate fin field-effect transistors on native (100) β-Ga2O3 substrate with high breakdown voltage [J].
Chabak, Kelson D. ;
Moser, Neil ;
Green, Andrew J. ;
Walker, Dennis E. ;
Tetlak, Stephen E. ;
Heller, Eric ;
Crespo, Antonio ;
Fitch, Robert ;
McCandless, Jonathan P. ;
Leedy, Kevin ;
Baldini, Michele ;
Wagner, Gunter ;
Galazka, Zbigniew ;
Li, Xiuling ;
Jessen, Gregg .
APPLIED PHYSICS LETTERS, 2016, 109 (21)
[5]   3.8-MV/cm Breakdown Strength of MOVPE-Grown Sn-Doped β-Ga2O3 MOSFETs [J].
Green, Andrew J. ;
Chabak, Kelson D. ;
Heller, Eric R. ;
Fitch, Robert C., Jr. ;
Baldini, Michele ;
Fiedler, Andreas ;
Irmscher, Klaus ;
Wagner, Guenter ;
Galazka, Zbigniew ;
Tetlak, Stephen E. ;
Crespo, Antonio ;
Leedy, Kevin ;
Jessen, Gregg H. .
IEEE ELECTRON DEVICE LETTERS, 2016, 37 (07) :902-905
[6]   State-of-the-art technologies of gallium oxide power devices [J].
Higashiwaki, Masataka ;
Kuramata, Akito ;
Murakami, Hisashi ;
Kumagai, Yoshinao .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2017, 50 (33)
[7]  
Hu Z., 2017, DNA RES INT J RAPID, V25, P1, DOI 10.1109/DRC.2017.7999512
[8]   Near unity ideality factor and Shockley-Read-Hall lifetime in GaN-on-GaN p-n diodes with avalanche breakdown [J].
Hu, Zongyang ;
Nomoto, Kazuki ;
Song, Bo ;
Zhu, Mingda ;
Qi, Meng ;
Pan, Ming ;
Gao, Xiang ;
Protasenko, Vladimir ;
Jena, Debdeep ;
Xing, Huili Grace .
APPLIED PHYSICS LETTERS, 2015, 107 (24)
[9]   High-voltage field effect transistors with wide-bandgap β-Ga2O3 nanomembranes [J].
Hwang, Wan Sik ;
Verma, Amit ;
Peelaers, Hartwin ;
Protasenko, Vladimir ;
Rouvimov, Sergei ;
Xing, Huili ;
Seabaugh, Alan ;
Haensch, Wilfried ;
Van de Walle, Chris G. ;
Galazka, Zbigniew ;
Albrecht, Martin ;
Fornari, Roberto ;
Jena, Debdeep .
APPLIED PHYSICS LETTERS, 2014, 104 (20)
[10]   1-kV vertical Ga2O3 field-plated Schottky barrier diodes [J].
Konishi, Keita ;
Goto, Ken ;
Murakami, Hisashi ;
Kumagai, Yoshinao ;
Kuramata, Akito ;
Yamakoshi, Shigenobu ;
Higashiwaki, Masataka .
APPLIED PHYSICS LETTERS, 2017, 110 (10)