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- [1] Enhancement-mode Ga2O3 wrap-gate fin field-effect transistors on native (100) β-Ga2O3 substrate with high breakdown voltageAPPLIED PHYSICS LETTERS, 2016, 109 (21)Chabak, Kelson D.论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Univ Illinois, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Urbana, IL 61801 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAMoser, Neil论文数: 0 引用数: 0 h-index: 0机构: George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAGreen, Andrew J.论文数: 0 引用数: 0 h-index: 0机构: Wyle Labs Inc, 4200 Colonel Glenn Hwy, Beavercreek, OH 45431 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAWalker, Dennis E.论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USATetlak, Stephen E.论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAHeller, Eric论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USACrespo, Antonio论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAFitch, Robert论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAMcCandless, Jonathan P.论文数: 0 引用数: 0 h-index: 0机构: Wyle Labs Inc, 4200 Colonel Glenn Hwy, Beavercreek, OH 45431 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USALeedy, Kevin论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USABaldini, Michele论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAWagner, Gunter论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA论文数: 引用数: h-index:机构:Li, Xiuling论文数: 0 引用数: 0 h-index: 0机构: Univ Illinois, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Urbana, IL 61801 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAJessen, Gregg论文数: 0 引用数: 0 h-index: 0机构: Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
- [2] Enhancement-mode vertical (100) β-Ga2O3 FinFETs with an average breakdown strength of 2.7 MV cm-1JAPANESE JOURNAL OF APPLIED PHYSICS, 2023, 62 (SF)Tetzner, Kornelius论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyKlupsch, Michael论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyPopp, Andreas论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Kristallzuchtung IKZ, Max Born Str 2, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany论文数: 引用数: h-index:机构:Chou, Ta-Shun论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Kristallzuchtung IKZ, Max Born Str 2, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany论文数: 引用数: h-index:机构:Ickert, Karina论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyMatalla, Mathias论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyUnger, Ralph-Stephan论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyTreidel, Eldad Bahat论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyWolf, Mihaela论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany论文数: 引用数: h-index:机构:Wuerfl, Joachim论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, GermanyHilt, Oliver论文数: 0 引用数: 0 h-index: 0机构: Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany
- [3] Study on self heating effect of enhancement-mode Ga2O3 vertical MOSFETSCIENTIA SINICA-PHYSICA MECHANICA & ASTRONOMICA, 2022, 52 (09)Guo LiangLiang论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaLuan SuZhen论文数: 0 引用数: 0 h-index: 0机构: Xian Univ Sci & Technol, Sch Comunicat & Informat Engn, Xian 710054, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaZhang HongPeng论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaQiao RunDi论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaYu JianGang论文数: 0 引用数: 0 h-index: 0机构: North Univ China, Sch Instrument & Elect, State Key Lab Dynam Measurement Technol, Taiyuan 030051, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaZhang YuMing论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaJia RenXu论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
- [4] Study on a novel vertical enhancement-mode Ga2O3 MOSFET with FINFET structureChinese Physics B, 2022, 31 (01) : 640 - 645论文数: 引用数: h-index:机构:张玉明论文数: 0 引用数: 0 h-index: 0机构: The Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University The Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University栾苏珍论文数: 0 引用数: 0 h-index: 0机构: Xi'an University of Science and Technology The Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University论文数: 引用数: h-index:机构:贾仁需论文数: 0 引用数: 0 h-index: 0机构: The Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University The Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University
- [5] Demonstration of 4.7 kV breakdown voltage in NiO/β-Ga2O3 vertical rectifiersAPPLIED PHYSICS LETTERS, 2022, 121 (04)Li, Jian-Sian论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAChiang, Chao-Ching论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAXia, Xinyi论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAYoo, Timothy Jinsoo论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USARen, Fan论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAKim, Honggyu论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAPearton, S. J.论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA
- [6] Reproducible NiO/Ga2O3 Vertical Rectifiers with Breakdown Voltage > 8 kVCRYSTALS, 2023, 13 (06)Li, Jian-Sian论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAWan, Hsiao-Hsuan论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAChiang, Chao-Ching论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAXia, Xinyi论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAYoo, Timothy Jinsoo论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAKim, Honggyu论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USARen, Fan论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USAPearton, Stephen J.论文数: 0 引用数: 0 h-index: 0机构: Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32606 USA Univ Florida, Dept Chem Engn, Gainesville, FL 32606 USA
- [7] Recessed-Gate Enhancement-Mode β-Ga2O3 MOSFETsIEEE ELECTRON DEVICE LETTERS, 2018, 39 (01) : 67 - 70Chabak, Kelson D.论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAMcCandless, Jonathan P.论文数: 0 引用数: 0 h-index: 0机构: KBRWyle, Beavercreek, OH 45440 USA Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14853 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAMoser, Neil A.论文数: 0 引用数: 0 h-index: 0机构: George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAGreen, Andrew J.论文数: 0 引用数: 0 h-index: 0机构: KBRWyle, Beavercreek, OH 45440 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAMahalingam, Krishnamurthy论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USACrespo, Antonio论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAHendricks, Nolan论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAHowe, Brandon M.论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USATetlak, Stephen E.论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USALeedy, Kevin论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAFitch, Robert C.论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAWakimoto, Daiki论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USASasaki, Kohei论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAKuramata, Akito论文数: 0 引用数: 0 h-index: 0机构: Novel Crystal Technol Inc, Sayama, Osaka 3501328, Japan Tamura Corp, Sayama, Osaka 3501328, Japan US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USAJessen, Gregg H.论文数: 0 引用数: 0 h-index: 0机构: US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA US Air Force, Sensors Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
- [8] Single and multi-fin normally-off Ga2O3 vertical transistors with a breakdown voltage over 2.6 kV2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2019,Li, W.论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USANomoto, K.论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USAHu, Z.论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA论文数: 引用数: h-index:机构:Jena, D.论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USAXing, H. G.论文数: 0 引用数: 0 h-index: 0机构: Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
- [9] Breakdown voltage enhancement techniques in β-Ga2O3 nanomembrane MESFETs10TH INTERNATIONAL CONFERENCE ON ELECTRONICS, COMPUTING AND COMMUNICATION TECHNOLOGIES, CONECCT 2024, 2024,论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [10] Enhancement-Mode β-Ga2O3 Current Aperture Vertical MOSFETs With N-Ion-Implanted BlockerIEEE ELECTRON DEVICE LETTERS, 2020, 41 (02) : 296 - 299Wong, Man Hoi论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Informat & Commun Technol, Tokyo 1848795, Japan Univ Massachusetts, Dept Elect & Comp Engn, Lowell, MA 01854 USA Natl Inst Informat & Commun Technol, Tokyo 1848795, Japan论文数: 引用数: h-index:机构:Kumagai, Yoshinao论文数: 0 引用数: 0 h-index: 0机构: Tokyo Univ Agr & Technol, Dept Appl Chem, Tokyo 1848588, Japan Natl Inst Informat & Commun Technol, Tokyo 1848795, JapanHigashiwaki, Masataka论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Informat & Commun Technol, Tokyo 1848795, Japan Natl Inst Informat & Commun Technol, Tokyo 1848795, Japan