New FIDES Models for Emerging Technologies

被引：0

作者：

Carton, Patrick ^{[1
]}

Giraudeau, Michel ^{[2
]}

Davenel, Franck ^{[3
]}

机构：

[1] Thales Global Serv, Ind Technol & Proc, 19-21 Ave Morane Saulnier, F-78140 Velizy Villacoublay, France

[2] Thales Airborne Syst, 2 Ave Gay Lussac, F-78851 Elancourt, France

[3] French MoD, Elect Reliabil Policy, Paris, France

来源：

2017 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 2017年

关键词：

Emerging technologies; FIDES; Maintainability; Reliability Prediction Models; Physics of failures;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

The purpose of this paper is to describe the PISTIS project, mainly focused on the reliability of emerging technologies involved in electronic systems. PISTIS is a French acronym, meaning faith, trust and confidence, from the Greek origin. Managing the reliability risk is a big challenge in rugged environments. PISTIS is linked to FIDES, a guide allowing reliability prediction of electronic systems. Results from in-service study presented in this paper show the accordance between FIDES predictions and reliability observed. This confirmed the interest to complete FIDES models by taking into account intrinsic wear-out effects limiting the operating lifetime. The PISTIS project started in 2015. Depending on the technologies and their main failure mechanisms, different long-term test processes are set up to evaluate the wear-out effects. To be able to construct reliability prediction models taking into account these effects, the stress level of reliability tests need to be close to the actual extreme use conditions and mission profiles in which electronic equipment are used.

引用

页数：6