An on-chip spectrum analyzer for analog built-in testing

This paper presents an analog built-in testing (BIT) architecture and its implementation. It enables the frequency response and harmonic distortion characterizations of an integrated device-under-test (DUT) through a digital off-chip interface. External analog instrumentation is avoided, reducing test time and cost. The proposed on-chip testing scheme uses a digital frequency synthesizer and a simple signal generator synchronized with a switched capacitor bandpass filter. A general methodology for the use of this structure in the functional verification of a DUT is also provided. The circuit-level design and experimental results of an integrated prototype in standard CMOS 0.5 mu m technology are presented to demonstrate the feasibility of the proposed BIT technique.