Application of X-ray absorption spectroscopy in materials science

被引：0

作者：

Briois, V ^{[1
]}

Giorgetti, C ^{[1
]}

Baudelet, F ^{[1
]}

Flank, AM ^{[1
]}

Tokumoto, MS ^{[1
]}

Pulcinelli, SH ^{[1
]}

Santilli, CV ^{[1
]}

机构：

[1] Ctr Univ Paris Sud, LURE, F-91898 Orsay, France

来源：

SPECTROSCOPY OF EMERGING MATERIALS | 2004年 / 165卷

关键词：

synchrotron radiation; X-ray absorption spectroscopy; EXAFS; nanocrystalline materials;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Short-range order information around a given atom obtained by the EXAFS (Extended X-ray Absorption Fine Structure) technique, concerning nanocrystalline materials, is reviewed. The potentialities of the technique to characterise bulk materials, thin films, and structural evolution during the preparation of nanoparticles using in situ set-ups are presented.

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页码：15 / 30

页数：16

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