Giant dielectric permittivity of electron-doped manganite thin films, Ca1-xLaxMnO3 (0≤x≤0.03) -: art. no. 034102

被引:42
作者
Cohn, JL [1 ]
Peterca, M
Neumeier, JJ
机构
[1] Univ Miami, Dept Phys, Coral Gables, FL 33124 USA
[2] Montana State Univ, Dept Phys, Bozeman, MT 59717 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1834976
中图分类号
O59 [应用物理学];
学科分类号
摘要
A giant low-frequency, in-plane dielectric constant, epsilon similar to 10(6), for epitaxial thin films of Ca1-xLaxMnO3 (x less than or equal to 0.03) was observed over a broad temperature range, 4 K less than or equal to T less than or equal to 300 K. This phenomenon is attributed to an internal barrier-layer capacitor (IBLC) structure, with Schottky contacts between semiconducting grains. The room-temperature epsilon increases substantially with electron (La) doping, consistent with a simple model for IBLCs. The measured values of epsilon exceed those of conventional two-phase IBLC materials based on (Ba, Sr)TiO3 as well as on recently discovered CaCu3Ti4O12 and (Li, Ti)-doped NiO. (C) 2005 American Institute of Physics.
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页数:4
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