High-quality AlN template grown on a patterned Si(111) substrate

被引:14
作者
Binh Tinh Tran [1 ]
Hirayama, Hideki [1 ]
Jo, Masafumi [1 ]
Maeda, Noritoshi [1 ]
Inoue, Daishi [2 ]
Kikitsu, Tomoka [2 ]
机构
[1] RIKEN, Quantum Optodevice Lab, 2-1 Hirosawa, Wako, Saitama 3510198, Japan
[2] RIKEN, Mat Characterizat Support Unit, Ctr Emergent Matter Sci, 2-1 Hirosawa, Wako, Saitama 3510198, Japan
关键词
MOCVD; AlN; Pattern; Si; LEDs; SI; 111; GAN FILMS; OVERGROWTH; DEPOSITION; MOVPE;
D O I
10.1016/j.jcrysgro.2016.12.100
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
To obtain a high-quality AlN template on a Si substrate for high-quantum efficiency AlGaN-based deep-UV LED applications, we fabricated a high-density micro-patterned Si(111) substrate. An about 8-mu m-thick AlN template was grown on the Si(111) substrate in a metal-organic chemical vapor deposition reactor by using NH3 pulsed-flow multilayer AlN growth and epitaxial lateral overgrowth methods. The template had a small Xray full width at half-maximum with rocking curves of 620 and 1141. for the symmetric and asymmetric (002 and 102) planes. A threading dislocation density at the best region as low as 107 cm(-2) was also obtained.
引用
收藏
页码:225 / 229
页数:5
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