Structure determination of nanocomposites through 3D imaging using laboratory XPS and multivariate analysis

被引:10
作者
Artyushkova, K. [1 ]
机构
[1] Univ New Mexico, Dept Chem & Nucl Engn, Albuquerque, NM 87131 USA
基金
美国国家科学基金会;
关键词
X-ray photoelectron imaging; Multivariate analysis; 3D imaging; Image fusion; Peak shape analysis; Depth profiling; RAY PHOTOELECTRON-SPECTROSCOPY; STATISTICAL-ANALYSIS; DEPTH-RESOLUTION; SPECTROMICROSCOPY; QUANTIFICATION; REGISTRATION; ALGORITHM; ACCURACY; SPECTRA; IMAGES;
D O I
10.1016/j.elspec.2009.05.014
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The purpose of this review is to introduce current trends and future directions in efforts to obtain 3D images of materials both destructively and non-destructively by means of X-ray photoelectron spectroscopy. Non-destructive methods for creating a 3D volume of the material include peak shape analysis, image fusion of angle-resolved images, combination of ARXPS and mapping and multivariate analysis of ARXPS data. Destructive sputtering of nanocomposite samples with ion beams followed by analysis with X-ray photoelectron spectroscopy represents a powerful strategy for in-depth characterization of complex materials. The combination of photoelectron imaging with depth profiling to create 3D images is essential for accurate structure determination of laterally and vertically heterogeneous materials. There are only a few reports in the scientific literature, however, describing this approach. Advances towards realization of these experiments with assistance of multivariate analysis will be discussed. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:292 / 302
页数:11
相关论文
共 53 条
[1]   Angle resolved imaging of polymer blend systems: From images to a 3D volume of material morphology [J].
Artyushkova, K ;
Fulghum, JE .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2005, 149 (1-3) :51-60
[2]   Multivariate image analysis methods applied to XPS imaging data sets [J].
Artyushkova, K ;
Fulghum, JE .
SURFACE AND INTERFACE ANALYSIS, 2002, 33 (03) :185-195
[3]   Quantification of PVC-PMMA polymer blend compositions by XPS in the presence of x-ray degradation effects [J].
Artyushkova, K ;
Fulghum, JE .
SURFACE AND INTERFACE ANALYSIS, 2001, 31 (05) :352-+
[4]  
ARTYUSHKOVA K, SOFTWARE MATLAB GUI
[5]   A metric for testing the accuracy of cross-modality image registration: Validation and application [J].
Black, KJ ;
Videen, TO ;
Perlmutter, JS .
JOURNAL OF COMPUTER ASSISTED TOMOGRAPHY, 1996, 20 (05) :855-861
[6]   PARAFAC. Tutorial and applications [J].
Bro, R .
CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, 1997, 38 (02) :149-171
[7]   Molecular depth profiling with cluster ion beams [J].
Cheng, J ;
Wucher, A ;
Winograd, N .
JOURNAL OF PHYSICAL CHEMISTRY B, 2006, 110 (16) :8329-8336
[8]  
CUMPSON P, ARCTICK
[9]   ANGLE-RESOLVED XPS AND AES - DEPTH-RESOLUTION LIMITS AND A GENERAL COMPARISON OF PROPERTIES OF DEPTH-PROFILE RECONSTRUCTION METHODS [J].
CUMPSON, PJ .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 73 (01) :25-52
[10]   On the road to high-resolution 3D molecular imaging [J].
Delcorte, Arnaud .
APPLIED SURFACE SCIENCE, 2008, 255 (04) :954-958