共 14 条
[2]
Chen HJ, 2008, COMPUT INFORM, V27, P5
[4]
A simple via duplication tool for yield enhancement.
[J].
2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS,
2001,
:39-47
[5]
Numerical Modeling and characterization of the stress migration Behavior upon various 90 nanometer Cu/Low k interconnects
[J].
PROCEEDINGS OF THE IEEE 2003 INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE,
2003,
:207-209
[6]
Karp R.M., 1972, COMPLEXITY COMPUTER, P85
[7]
Lee KY, 2006, ASIA S PACIF DES AUT, P303
[8]
LEE KY, 2008, OPTIMAL POSTROUTING, P111
[9]
Luo F, 2006, ASIA S PACIF DES AUT, P730
[10]
Park S, 2006, INT CONF ACOUST SPEE, P3363