Interfacial Reaction Between Nb Foil and n-Type PbTe Thermoelectric Materials During Thermoelectric Contact Fabrication

被引:31
作者
Xia, Haiyang [1 ,2 ,3 ]
Chen, Cheng-Lung [1 ,4 ]
Drymiotis, Fivos [1 ]
Wu, Aiping [2 ,3 ]
Chen, Yang-Yuan [4 ]
Snyder, G. Jeffrey [1 ]
机构
[1] CALTECH, Dept Mat Sci, Pasadena, CA 91125 USA
[2] Tsinghua Univ, Dept Mech Engn, Beijing 100084, Peoples R China
[3] Minist Educ, Key Lab Adv Mat Proc Technol, Beijing, Peoples R China
[4] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
关键词
PbTe-based thermoelectric materials; Nb foil; Nb/PbTe joints; hot-press sintering; RELIABILITY EVALUATION; LEAD-TELLURIDE; EVOLUTION;
D O I
10.1007/s11664-014-3350-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
PbTe is a high-conversion-efficiency thermoelectric (TE) material that is commonly used in space exploration applications. Integration of PbTe in TE devices has a significant impact on the conversion efficiency and reliability of TE devices. Hence, our effort focuses on developing novel approaches for bonding metallic contacts to PbTe to improve device performance and reliability. In this study, pure Nb foil was directly bonded to PbTe-based TE materials to fabricate the hot-side contacts of TE elements using a rapid hot-press. The materials were sintered at 700A degrees C under pressure of 40 MPa for various holding times. We found that a reaction layer of needle-like Nb3Te4 mixed with Pb forms at the interface of the Nb/PbTe joints and that Pb is distributed in the gaps of the Nb3Te4 grains. We analyze the resulting microstructure and finally calculate the time exponent of the growth kinetics of the Nb3Te4 layer. Fracture surface analysis showed that the Nb/PbTe joint fractures at the interface between Nb and Nb3Te4 and within the PbTe matrix, indicating that the bonding between Nb and Nb3Te4 is weak.
引用
收藏
页码:4064 / 4069
页数:6
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