Time-Resolved Nanostructural Analysis of Thin-Film Formation Process from Nafion Solution by Synchrotron X-ray Scattering

被引：3

作者：

Konosu, Y. ^{[1
]}

Masunaga, H. ^{[2
]}

Hikima, T. ^{[3
]}

Tokita, M. ^{[4
]}

Matsumoto, H. ^{[1
]}

Sasabe, T. ^{[5
]}

Yoshida, T. ^{[5
]}

Shinohara, K. ^{[6
]}

Hirai, S. ^{[5
]}

机构：

[1] Tokyo Inst Technol, Dept Mat Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan

[2] Japan Synchrotron Radiat Res Inst JASRI SPring 8, 1-1-1 Kouto, Sayo, Sayo 6795198, Japan

[3] RIKEN, SPring Ctr 8, 1-1-1 Kouto, Sayo, Sayo 6795148, Japan

[4] Tokyo Inst Technol, Dept Chem Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan

[5] Tokyo Inst Technol, Dept Mech Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan

[6] Technol Res Assoc, Fuel Cell Cutting Edge Res Ctr FC Cub, Koto Ku, AIST Tokyo Waterfront Main Bldg,2-3-26 Aomi, Tokyo 1350064, Japan

来源：

POLYMER ELECTROLYTE FUEL CELLS 16 (PEFC 16) | 2016年 / 75卷 / 14期

关键词：

D O I：

10.1149/07514.0637ecst

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The dynamics of thin-film formation process from Nafion solution induced by solvent evaporation were investigated by in-situ timeresolved grazing-incidence small-and wide-angle X-ray scattering (GISAXS/GIWAXS) measurements utilizing synchrotron radiation. GISAXS/GIWAXS measurements revealed subnano-to nanoscaled structural development during thin-film formation process from Nafion solution. In the early stage, solvent evaporation decreased the distance between the scatter structures in Nafion solution. With the solvent evaporation, the ordered structures with a spacing of 3.3 nm appeared and finally solidified. In-situ timeresolved GISAXS/GIWAXS techniques provide a powerful tool to investigate the development of structures during thin-film formation process from polymer solutions including ionomer solution.

引用

页码：637 / 642

页数：6

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