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- [22] Reliability Issues in Flash Memories: An On-Line Diagnosis and Repair Scheme for Word Line Drivers 2008 IEEE 14TH INTERNATIONAL MIXED-SIGNALS, SENSORS, AND SYSTEMS TEST WORKSHOP, 2008, : 176 - 181
- [23] Electrical Method to Localize the High-Resistance of Nanoscale CoSi2 Word-Line for OTP Memories 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,
- [24] Methodology for word line-contact dielectric characterization in flash nor memories 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 2007, : 580 - +
- [28] Error Suppression of Last-Programmed Word-Line for Real Usage of 3D-NAND Flash Memory 2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2021,
- [29] Charge-transferred presensing and efficiently precharged negative word-line schemes for low-voltage DRAMs 2003 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2003, : 289 - 292
- [30] Effect of Traps on Transient Bit-line Current Behavior in Word-line Stacked NAND Flash Memory with Poly-Si Body 2014 SYMPOSIUM ON VLSI TECHNOLOGY (VLSI-TECHNOLOGY): DIGEST OF TECHNICAL PAPERS, 2014,