The synthesis of CeO2+n•n H2O nanolayers on silicon and fused-quartz surfaces by the successive ionic layer deposition technique

被引:28
作者
Tolstoy, VP [1 ]
Ehrlich, AG [1 ]
机构
[1] St Petersburg State Univ, Dept Solid State Chem, St Petersburg 198904, Russia
关键词
successive ionic-layer deposition and silicon; fused-quartz; nanolayers;
D O I
10.1016/S0040-6090(97)00301-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
For the first time, the conditions of the synthesis of CeO2+n. n H2O nanolayers by the method of successive layer-by-layer ionic deposition have been determined. The influence of the conditions of CeO2+n. n H2O nanolayer synthesis, such as the concentration and pH of the reactant solutions, the duration of treatment with them, and the number of ion-deposition cycles on kinetics of the layer growth on a silicon surface, were investigated. The deposited layers were studied through the methods of ellipsometry, UV-Vis and FTIR spectroscopy. When cerium acetate and hydrogen peroxide in a weak alkaline medium were used as the reactants. the surface film undergoes regular linear growth and its thickness can be controlled at the level of less than a nanometer. The prepared layers were investigated after heating in air at temperatures in the 100-500 degrees C range. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:60 / 64
页数:5
相关论文
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