Magnetic force microscopy imaging of current paths

被引：0
|
作者：
Yongsunthon, R [1 ]
Stanishevsky, A [1 ]
Rous, PJ [1 ]
Williams, ED [1 ]
机构：
[1] Univ Maryland, Dept Phys, College Pk, MD 20742 USA
来源：
SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES | 2003年 / 738卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrate Magnetic Force Microscopy (MFM) imaging, at room temperature in air, of a 0.25mA DC current path in a 140nm-wide gold nanowire: The nanowire was created by focused ion beam milling of a 12mum wide Cr/Au line of 20nm/110nm Cr/Au thickness. Iterative fitting of the MFM data to an idealized model of the structure yielded a nanowire resistivity a factor of 3.5 higher than that of a control Cr/Au region which was unaffected by the ion beam processing. MFM imaging of an ion-implant patterned line shows current deflection around the implant region.
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页码：189 / 194
页数：6
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