Temperature-resolved infrared spectral emissivity of SiC and Pt-10Rh for temperatures up to 900°C

被引：87

作者：

Cagran, Claus P. ^{[1
]}

Hanssen, Leonard M. ^{[1
]}

Noorma, Mart ^{[1
]}

Gura, Alex V. ^{[1
]}

Mekhontsev, Sergey N. ^{[1
]}

机构：

[1] NIST, Opt Tech Div, Gaithersburg, MD 20899 USA

来源：

INTERNATIONAL JOURNAL OF THERMOPHYSICS | 2007年 / 28卷 / 02期

关键词：

infrared; platinum-10% rhodium; silicon-carbide; spectral emissivity; spectral emittance; sphere reflectometer;

D O I：

10.1007/s10765-007-0183-1

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

This article reports the first comprehensive results obtained from a fully functional, recently established infrared spectral-emissivity measurement facility at the National Institute of Standards and Technology (NIST). First, sample surface temperatures are obtained with a radiometer using actual emittance values from a newly designed sphere reflectometer and a comparison between the radiometer temperatures and contact thermometry results is presented. Spectral emissivity measurements are made by comparison of the sample spectral radiance to that of a reference blackbody at a similar (but not identical) temperature. Initial materials selected for measurement are potential candidates for use as spectral emissivity standards or are of particular technical interest. Temperature-resolved measurements of the spectral directional emissivity of SiC and Pt-10Rh are performed in the spectral range of 2-20 mu m, over a temperature range from 300 to 900 degrees C at normal incidence. Further, a careful study of the uncertainty components of this measurement is presented.

引用

页码：581 / 597

页数：17