Single Event Upset Characterization of the Spartan-6 Field Programmable Gate Array Using Proton Irradiation

被引：0

作者：

Hiemstra, David M. ^{[1
]}

Kirischian, Valeri ^{[1
]}

机构：

[1] MDA, Brampton, ON L6S 4J3, Canada

来源：

2013 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2013年

关键词：

single event upset; SRAM FPGA; proton irradiation; Spartan-6;

D O I：

暂无

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Spartan-6 FPGA are presented. Upset rates in the space radiation environment are estimated.

引用

页数：4

共 10 条

[1] Operation of the TRIUMF (20-500 MeV) Proton Irradiation Facility [J].

Blackmore, EW .

2000 IEEE RADIATION EFFECTS DATA WORKSHOP - WORKSHOP RECORD, 2000, :1-5

[2]

Hiemstra D., 2012, IEEE REDW, P124

[3]

Hiemstra D., 2010, IEEE REDW, P4

[4]

Hiemstra DM, 2006, NSREC: 2006 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, P105

[5]

Hiemstra DM, 2005, NSREC: 2005 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, P46

[6] Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation [J].

Hiemstra, DM ;

Chayab, F ;

Szajek, L .

2004 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2004, :79-84

[7] Latchup in integrated circuits from energetic protons [J].

Johnston, AH ;

Swift, GM ;

Edmonds, LD .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :2367-2377

[8] Internuclear cascade - Evaporation model for LET spectra of 200 MeV protons used for parts testing [J].

O'Neill, PM ;

Badhwar, GD ;

Culpepper, WX .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) :2467-2474

[9] Risk assessment for heavy ions of parts tested with protons [J].

O'Neill, PM ;

Badhwar, GD ;

Culpepper, WX .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :2311-2314

[10] The SEU figure of merit and proton upset rate calculations [J].

Petersen, EL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) :2550-2562

← 1 →