Fault diagnosis of electronic analog circuits using a radial basis function network classifier

被引:70
作者
Catelani, M
Fort, A
机构
[1] Univ Florence, Dipartimento Ingn Elettron, Florence, Italy
[2] Univ Siena, Dipartimento Ingn Informaz, I-53100 Siena, Italy
关键词
radial basis function networks; fault diagnosis; neural classifiers;
D O I
10.1016/S0263-2241(00)00008-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper a fault diagnosis technique, which employs neural networks to analyze signatures of analog circuits, is proposed. Radial basis functions networks (RBFN) are used to process circuit input-output measurements, and to perform soft fault location. Both noise and effect of parameter variations in the tolerance ranges of non-faulty components are taken into account. The network is trained with circuit signatures,obtained by measuring and coding both circuit input and output signals, which are contained in a 'fault dictionary'. In this context RBFN architecture is selected, because it is able to cope with 'new fault' conditions not well represented in the fault dictionary used for network training. The RBFN classifier was applied to linear and non-linear sample circuits, considering faults both at sub-system level and at component level. Simulations and experimental results show that the developed nets succeeded in classifying faults. The nets trained with single faults has in many cases detected also multiple faults. (C) 2000 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:147 / 158
页数:12
相关论文
共 11 条
  • [1] FAULT-DIAGNOSIS OF ANALOG CIRCUITS
    BANDLER, JW
    SALAMA, AE
    [J]. PROCEEDINGS OF THE IEEE, 1985, 73 (08) : 1279 - 1325
  • [2] Catelani M., 1996, Measurement, V17, P73, DOI 10.1016/0263-2241(96)00012-7
  • [3] Huertas JL, 1993, ECCTD 93 CIRCUIT THE, P75
  • [4] *INT STAND CEI IEC, 1991, 50191 CEI IEC
  • [5] Leonard J. A., 1991, IEEE Control Systems Magazine, V11, P31, DOI 10.1109/37.75576
  • [6] USING RADIAL BASIS FUNCTIONS TO APPROXIMATE A FUNCTION AND ITS ERROR-BOUNDS
    LEONARD, JA
    KRAMER, MA
    UNGAR, LH
    [J]. IEEE TRANSACTIONS ON NEURAL NETWORKS, 1992, 3 (04): : 624 - 626
  • [7] LEONARD JA, 1993, IEEE EXPERT APR, P44
  • [8] LIU RW, 1991, TESTING DIAGNOSIS AN
  • [9] Linear circuit fault diagnosis using neuromorphic analyzers
    Spina, R
    Upadhyaya, S
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1997, 44 (03): : 188 - 196
  • [10] Wassermann PD, 1993, ADV METHODS NEURAL C