Microwave studies on double rare earth oxalate crystals

被引：11

作者：

Elizabeth, A

Joseph, C

Paul, I

Ittyachen, MA

Mathew, KT ^{[1
]}

Lonappan, A

Jacob, J

机构：

[1] Mahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, India

[2] Cochin Univ Sci & Technol, Dept Elect, Microwave Imaging & Mat Res Lab, Kochi 682022, India

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2005年 / 391卷 / 1-2期

关键词：

rare earth oxalate; crystal growth; complex permittivity; microwaves; cavity perturbation; X-ray; IR analysis;

D O I：

10.1016/j.msea.2004.09.011

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Rare earth compounds are recognized for outstanding physical, magnetic and optical properties. The oxalates and molybdates have gained importance for their various properties, which find applications in electro and accusto optical devices. This paper reports the microwave dielectric studies on double rare earth oxalate crystals. Using the cavity perturbation technique dielectric parameters such as complex permittivity and conductivity at microwave frequencies is determined. Using X-ray diffraction study the crystalline nature of the samples was established. The molecular and crystal structures were identified by IR analysis. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：43 / 50

页数：8

共 16 条

[1] Judd-Ofelt intensity parameters and laser analysis of Pr3+ doped phosphate glasses sensitized by Mn2+ ions [J].