Glow discharge mass spectrometry

被引:132
作者
Hoffmann, V [1 ]
Kasik, M
Robinson, PK
Venzago, C
机构
[1] Leibniz Inst Solid State & Mat Res Dresden, D-01171 Dresden, Germany
[2] Shiva Technol Inc, Syracuse, NY 13211 USA
[3] Mass Spectrometry Int, Hanover Business Pk, Altrincham, Cheshire, England
[4] Degussa AG, D-63457 Hanau, Germany
关键词
glow discharge mass spectrometry; depth profile; temperature; fast flow; pulse;
D O I
10.1007/s00216-004-2933-2
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
Over the past twenty years or so, glow discharge mass spectrometry (GDMS) has become the industry standard for the analysis of trace elements in metals and semiconductors. A review of its history is followed by a picture of the present situation and a look to where the future may lie. Applications are summarised, including the ability of GDMS to offer depth-resolved data and non-conductor analysis, and the well-documented quantitative nature of the results is reviewed. The effects resulting from the physical properties of the analyte material are discussed at length. Finally, recent work such as "fast flow" sources and pulsed glow discharges is reviewed.
引用
收藏
页码:173 / 188
页数:16
相关论文
共 166 条
  • [1] Investigation of mechanisms of corrosion due to diffusion of impurities by direct current glow discharge mass spectrometry depth profiling
    Actis-Dato, LO
    de Las Heras, LA
    Betti, M
    Toscano, EH
    Miserque, F
    Gouder, T
    [J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2000, 15 (11) : 1479 - 1484
  • [2] ADALVE L, 2000, MICROCHEM J, V67, P333
  • [3] ADAMS F, 1988, CHEM ANAL
  • [4] [Anonymous], 2003, Glow Discharge Plasmas in Analytical Spectroscopy
  • [5] ARKHIPENKO VI, 1998, ICPP 25 EPS C CONTR, V22, P2671
  • [6] ION-INDUCED ELECTRON-EMISSION FROM CLEAN METALS
    BARAGIOLA, RA
    ALONSO, EV
    FERRON, J
    OLIVAFLORIO, A
    [J]. SURFACE SCIENCE, 1979, 90 (02) : 240 - 255
  • [7] BARAGIOLA RA, 1993, NATO ASI SERIES B, V306
  • [8] Characterization of a focal plane camera fitted to a Mattauch-Herzog geometry mass spectrograph. 1. Use with a glow-discharge source
    Barnes, JH
    Sperline, R
    Denton, MB
    Barinaga, CJ
    Koppenaal, D
    Young, ET
    Hieftje, GM
    [J]. ANALYTICAL CHEMISTRY, 2002, 74 (20) : 5327 - 5332
  • [9] Glow discharge atomic spectrometry for the analysis of environmental samples - a review
    Baude, S
    Broekaert, JAC
    Delfosse, D
    Jakubowski, N
    Fuechtjohann, L
    Orellana-Velado, NG
    Pereiro, R
    Sanz-Medel, A
    [J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2000, 15 (11) : 1516 - 1525
  • [10] BAUDE S, 1997, THESIS U PIERRE MARI