Experimental test of strong pinning and creep in current-voltage characteristics of type-II superconductors

被引:7
|
作者
Buchacek, M. [1 ]
Xiao, Z. L. [2 ]
Dutta, S. [3 ]
Andrei, E. Y. [4 ]
Raychaudhuri, P. [3 ]
Geshkenbein, V. B. [1 ]
Blatter, G. [1 ]
机构
[1] EIH Zurich, Inst Theoret Phys, CH-8093 Zurich, Switzerland
[2] Argonne Natl Lab, Mat Sci Div, Lemont, IL 60439 USA
[3] Tata Inst Fundamental Res, Homi Bhabha Rd, Mumbai 400005, Maharashtra, India
[4] Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08855 USA
基金
美国国家科学基金会; 瑞士国家科学基金会;
关键词
FLUX-CREEP; MOTION; VORTICES;
D O I
10.1103/PhysRevB.100.224502
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pinning and creep determine the current-voltage characteristics of a type-II superconductor and thereby its potential for technological applications. The recent development of strong pinning theory provides us with a tool to assess a superconductor's electric properties in a quantitative way. Motivated by the observation of typical excess-current characteristics and field scaling of critical currents, here we analyze current-voltage characteristics measured on 2H-NbSe2 and a-MoGe type-II superconductors within the setting provided by strong pinning theory. The experimentally observed shift and rounding of the voltage onset is consistent with the predictions of strong pinning in the presence of thermal fluctuations. We find the underlying parameters determining pinning and creep and discuss their consistency.
引用
收藏
页数:11
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