Wavelength scaling of elliptical-polarization dependence of high-order harmonic generation

被引：14
|
作者：
Xu, Han [1 ]
Xiong, Hui [1 ]
Zeng, Bin [1 ]
Chu, Wei [1 ]
Fu, Yuxi [1 ]
Yao, Jingpin [1 ]
Chen, Jing [2 ,3 ]
Liu, Xiaojun [4 ]
Cheng, Ya [1 ]
Xu, Zhizhan [1 ]
机构：
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, State Key Lab High Field Laser Phys, Shanghai 201800, Peoples R China
[2] Peking Univ, Ctr Appl Phys & Technol, Beijing 100084, Peoples R China
[3] Inst Appl Phys & Computat Math, Beijing 100088, Peoples R China
[4] Chinese Acad Sci, Wuhan Inst Phys & Math, State Key Lab Magnet Resonance & Atom & Mol Phys, Wuhan 430071, Peoples R China
来源：
OPTICS LETTERS | 2010年 / 35卷 / 04期
基金：
中国国家自然科学基金;
关键词：
X-RAY; PULSES; ATOMS;
D O I：
10.1364/OL.35.000472
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report on an experimental study on the wavelength-scaling law of elliptical-polarization dependence of high-order harmonic generation. In the elliptical-polarization dependence measurements, we keep an identical peak intensity for pump pulses with carrier wavelength ranging from 800 nm to the mid-IR region, and the harmonic emission near the cutoff region is selected for comparison. We find that the experimental measured wavelength scaling of elliptical-polarization dependence could be well fitted with a function (epsilon(1/2) proportional to lambda(-1)) predicted by semiclassical model. (C) 2010 Optical Society of America
引用
收藏
页码：472 / 474
页数：3
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