Atomic force microscope in a contactless mode: Peculiarities of force interactions

被引：0

作者：

Rekhviashvili, SS ^{[1
]}

机构：

[1] Russian Acad Sci, Kabardino Balkarian Sci Ctr, Inst Appl Math & Automat, Nalchik, Russia

来源：

TECHNICAL PHYSICS LETTERS | 2000年 / 26卷 / 06期

关键词：

Atomic Force Microscope; Force Interaction; Probe Structure; Continuous Approximation; Point Shape;

D O I：

10.1134/1.1262896

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Forces of interaction between the atomic force microscope (AFM) probe and the surface of a solid are calculated with an allowance for the induced cantilever oscillations. A continuous approximation used in this work does not take into account discreteness of the sample and probe structures. Calculations have been performed for various AFM point shapes. It is theoretically demonstrated that the cantilever oscillations increase the interaction force. (C) 2000 MAIK "Nauka/Interperiodica".

引用

页码：517 / 519

页数：3

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