Image classification of sugar crystal with deep learning

被引:3
作者
Chayatummagoon, Suriya [1 ]
Chongstitvatana, Prabhas [1 ]
机构
[1] Chulalongkorn Univ, Fac Engn, Comp Engn Dept, Bangkok, Thailand
来源
2021 13TH INTERNATIONAL CONFERENCE ON KNOWLEDGE AND SMART TECHNOLOGY (KST-2021) | 2021年
关键词
component; Deep learning; Image Classification; Crystal Formation;
D O I
10.1109/KST51265.2021.9415841
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Nowadays, artificial intelligent control is essential to replace experienced workers. The correct classification of sugar crystals during the production process is the basis for the control of the sugar crystallization process. Correct Classification of sugar crystals is the basis necessary for automatic control of process. This research uses the principles of deep learning using a neural network to identify the crystallization of sugar from the actual production process of sugar factories in Thailand. Performance was measured and compared with the Fine-tuning VGG16 model. It was accurate to identify sugar crystals between 82% and 92% of four classes sugar crystal images classified by the crystallization conditions. The results of this study also show that this model is more accurate than other models. It can be used as a benchmark for monitoring the crystallization of sugar production processes. It is also the basis of an artificial intelligent control system based on transcribing human expertise
引用
收藏
页码:118 / 122
页数:5
相关论文
共 11 条
[1]   Classification of crystallization outcomes using deep convolutional neural networks [J].
Bruno, Andrew E. ;
Charbonneau, Patrick ;
Newman, Janet ;
Snell, Edward H. ;
So, David R. ;
Vanhoucke, Vincent ;
Watkins, Christopher J. ;
Williams, Shawn ;
Wilson, Julie .
PLOS ONE, 2018, 13 (06)
[2]  
Dhruba SR, 2018, IEEE ENG MED BIO, P1246, DOI 10.1109/EMBC.2018.8512457
[3]  
Ertam F, 2017, 2017 INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND ENGINEERING (UBMK), P755, DOI 10.1109/UBMK.2017.8093521
[4]  
Iteca A., 2020, SUGAR ASIA
[5]  
Jenkins G., 1966, SCI DIRECT, P267
[6]  
Marom Nadav David, 2010, 2010 IEEE 26th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2010), P555, DOI 10.1109/EEEI.2010.5662159
[7]  
Palenzuela E. S. G., 1996, Proceedings IWISPO '96. Third International Workshop on Image and Signal Processing on the Theme of Advances in Computational Intelligence, P641, DOI 10.1016/B978-044482587-2/50141-5
[8]  
Pieter H., BIBLIO CRYSTALLIZED, P234
[9]  
Suarez Luis Alberto Paz, 2009, Proceedings 2009 International Joint Conference on Neural Networks (IJCNN 2009 - Atlanta), P2990, DOI 10.1109/IJCNN.2009.5178663
[10]   Analysis of k-fold cross-validation over hold-out validation on colossal datasets for quality classification [J].
Yadav, Sanjay ;
Shukla, Sanyam .
2016 IEEE 6TH INTERNATIONAL CONFERENCE ON ADVANCED COMPUTING (IACC), 2016, :78-83