Materials for 3D packaging of electronic and optoelectronic systems

被引:4
作者
Ozguz, VH [1 ]
Yamaguchi, J
机构
[1] Irvine Sensors Corp, Adv Concepts Gr, Costa Mesa, CA USA
[2] Irvine Sensors Corp, Lab Operat, Costa Mesa, CA USA
关键词
electronic materials; microelectronics packaging and integration; three-dimensional (3D) packaging techniques;
D O I
10.1557/mrs2003.15
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Advanced three-dimensional (3D) packaging techniques for electronic components are promising for the realization of "systems-in-packages". Three-dimensional packages require the use of a variety of materials within a small physical size range. Materials selection is therefore critical from electrical, optical,mechanical, structural, thermal, and manufacturability viewpoints. The materials combination depends also on the intended application for the 3D packaged modules. This article reviews 3D packaging approaches, materials classes, and examples. Three-dimensional packaged systems using judiciously selected materials offer performance advantages that cannot be provided by planar implementation.
引用
收藏
页码:35 / 40
页数:6
相关论文
共 10 条
[1]   A review of 3-D packaging technology [J].
Al-Sarawi, SF ;
Abbott, D ;
Franzon, PD .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1998, 21 (01) :2-14
[2]  
EIDE F, 1990, Patent No. 4956694
[3]  
FREW D, 1990, P SOC PHOTO-OPT INS, V1346, P34
[4]   A 3-D stacked chip packaging solution for miniaturized massively parallel processing [J].
Lea, RM ;
Jalowiecki, IP ;
Boughton, DK ;
Yamaguchi, JS ;
Pepe, AA ;
Ozguz, VH ;
Carson, JC .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 1999, 22 (03) :424-432
[5]  
MINAHAN J, 1990, P 42 EL COMP TECHN C, P340
[6]  
OZGUZ V, 2000, P INT C HIGH DENS IN, P8
[7]  
OZGUZ V, 2000, P SPIE OPT CRIT REV, P225
[8]   THE FUNDAMENTAL LIMITS FOR ELECTRONIC PACKAGING AND SYSTEMS [J].
PENCE, WE ;
KRUSIUS, JP .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1987, 10 (02) :176-183
[9]  
Terrill R, 1996, 1996 IEEE AEROSPACE APPLICATIONS CONFERENCE, PROCEEDINGS, VOL 2, P347, DOI 10.1109/AERO.1996.495988
[10]  
VAL C, 1994, P 16 IEEE CPMT INT E, P387