3D ToF-SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate

被引：1

作者：

Zhang, Lei ^{[1
]}

Dai, Chunli ^{[1
]}

Zhang, Jie ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China

来源：

SURFACE AND INTERFACE ANALYSIS | 2020年 / 52卷 / 05期

基金：

国家重点研发计划;

关键词：

3D SIMS; ceramic coating; diffusion; interface; ToF-SIMS; zircaloy; THIN-FILM; PROGRESS;

D O I：

10.1002/sia.6715

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF-SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as-deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800 degrees C for only 5 minutes compared with that in the as-deposited sample.

引用

页码：306 / 310

页数：5

共 21 条

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