Multilevel radiative thermal memory realized by the hysteretic metal-insulator transition of vanadium dioxide

被引：72

作者：

Ito, Kota ^{[1
]}

Nishikawa, Kazutaka ^{[1
]}

Iizuka, Hideo ^{[1
]}

机构：

[1] Toyota Cent Res & Dev Labs Inc, Nagakute, Aichi 4801192, Japan

来源：

APPLIED PHYSICS LETTERS | 2016年 / 108卷 / 05期

关键词：

HEAT-FLOW; RECTIFICATION; TEMPERATURE; RECTIFIER;

D O I：

10.1063/1.4941405

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thermal information processing is attracting much interest as an analog of electronic computing. We experimentally demonstrated a radiative thermal memory utilizing a phase change material. The hysteretic metal-insulator transition of vanadium dioxide (VO2) allows us to obtain a multilevel memory. We developed a Preisach model to explain the hysteretic radiative heat transfer between a VO2 film and a fused quartz substrate. The transient response of our memory predicted by the Preisach model agrees well with the measured response. Our multilevel thermal memory paves the way for thermal information processing as well as contactless thermal management. (C) 2016 AIP Publishing LLC.

引用

页数：5

共 39 条

[1] INFRARED OPTICAL PROPERTIES OF VANADIUM DIOXIDE ABOVE AND BELOW TRANSITION TEMPERATURE [J].

BARKER, AS ;

VERLEUR, HW ;

GUGGENHEIM, HJ .

PHYSICAL REVIEW LETTERS, 1966, 17 (26) :1286-+

[2] Near-field radiative transfer based thermal rectification using doped silicon [J].

Basu, Soumyadipta ;

Francoeur, Mathieu .

APPLIED PHYSICS LETTERS, 2011, 98 (11)

[3] Near-Field Thermal Transistor [J].

Ben-Abdallah, Philippe ;

Biehs, Svend-Age .

PHYSICAL REVIEW LETTERS, 2014, 112 (04)

[4] Phase-change radiative thermal diode [J].

Ben-Abdallah, Philippe ;

Biehs, Svend-Age .

APPLIED PHYSICS LETTERS, 2013, 103 (19)

[5]

Bertotti G., 2006, SCI HYSTERESIS

[6]

Cao J, 2009, NAT NANOTECHNOL, V4, P732, DOI [10.1038/NNANO.2009.266, 10.1038/nnano.2009.266]

[7] Solid-state thermal rectifier [J].

Chang, C. W. ;

Okawa, D. ;

Majumdar, A. ;

Zettl, A. .

SCIENCE, 2006, 314 (5802) :1121-1124

[8] A hysteresis model for a vanadium dioxide transition-edge microbolometer [J].

de Almeida, LAL ;

Deep, GS ;

Lima, AMN ;

Neff, HF ;

Freire, RCS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (04) :1030-1035

[9] Thermal self-oscillations in radiative heat exchange [J].

Dyakov, S. A. ;

Dai, J. ;

Yan, M. ;

Qiu, M. .

APPLIED PHYSICS LETTERS, 2015, 106 (06)

[10] Near-field NanoThermoMechanical memory [J].

Elzouka, Mahmoud ;

Ndao, Sidy .

APPLIED PHYSICS LETTERS, 2014, 105 (24)

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