An analytic method for parameter extraction of InP HBTs small-signal model

被引:5
|
作者
Zhang, Jincan [1 ]
Liu, Min [1 ]
Wang, Jinchan [1 ]
Xu, Kun [1 ]
机构
[1] Henan Univ Sci & Technol, Elect Engn Coll, Luoyang, Peoples R China
基金
中国国家自然科学基金;
关键词
Current crowding; Heterojunction bipolar transistor; Parameter extraction; Small-signal equivalent circuit; T topology; EQUIVALENT-CIRCUIT; SIGE HBTS;
D O I
10.1108/CW-06-2020-0099
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Purpose High-speed Indium Phosphide (InP) HBTs have been widely used to design high-speed analog, digital and mixed-signal integrated circuits. The purpose of this study is to propose a new parameter extraction procedure for determining an improved T-topology small-signal equivalent circuit of InP heterojunction bipolar transistors (HBTs). Design/methodology/approach The alternating current crowding effect is considered through adding the intrinsic base capacitance in the small-signal equivalent circuit. All of the circuit parameters are extracted directly without using any approximation. Findings The extraction technique is more easily understood and clearer than other extraction methods, as the equations are derived from the S-parameters by peeling peripheral elements from small-signal models to get reduced ones and extracting each equivalent-circuit parameter using each equation. Originality/value To validate the presented parameter extraction technology, an n-p-n emitter-up InP HBT was analyzed adopting the method. Excellent agreement between measured and modeled S-parameters is obtained up to 40 GHz.
引用
收藏
页码:393 / 400
页数:8
相关论文
共 50 条
  • [41] A New Small-Signal Parameter Extraction Technique for Large Gate-Periphery GaN HEMTs
    Ahsan, Sheikh Aamir
    Pampori, Ahtisham-ul-Haq
    Ghosh, Sudip
    Khandelwal, Sourabh
    Chauhan, Yogesh Singh
    IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2017, 27 (10) : 918 - 920
  • [42] Stepping toward standard methods of small-signal parameter extraction for HBT's
    Sotoodeh, M
    Sozzi, L
    Vinay, A
    Khalid, AH
    Hu, ZR
    Rezazadeh, AA
    Menozzi, R
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (06) : 1139 - 1151
  • [43] RF Performance and Small-Signal Parameter Extraction of Junctionless Silicon Nanowire MOSFETs
    Cho, Seongjae
    Kim, Kyung Rok
    Park, Byung-Gook
    Kang, In Man
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (05) : 1388 - 1396
  • [44] A new small signal model parameter extraction method applied to GaN devices
    Jarndal, A
    Kompa, G
    2005 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-4, 2005, : 1423 - 1426
  • [45] Small-signal modeling of GaN HEMT switch with a new intrinsic elements extraction method
    Geng, Miao
    Li, Pei-Xian
    Luo, Wei-Jun
    Sun, Peng-Peng
    Zhang, Rong
    Ma, Xiao-Hua
    CHINESE PHYSICS B, 2016, 25 (11)
  • [46] Direct extraction method of HEMT switch small-signal model with multiparasitic capacitive current path
    Tao, Yuan
    Hu, Zhi Fu
    Fan, Yong
    Liu, Ya Nan
    He, Mei Lin
    Cheng, Yu Jian
    Zhang, Bo
    INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 2019, 29 (06)
  • [47] A new small-signal modeling and extraction method in AlGaN/GaN HEMTs
    Lu, Jing
    Wang, Yan
    Ma, Long
    Yu, Zhiping
    SOLID-STATE ELECTRONICS, 2008, 52 (01) : 115 - 120
  • [48] InGaAs/InP DHBT small-signal model up to 325 GHz with two intrinsic base resistances
    Chen, Yapei
    Zhang, Yong
    Li, Xiao
    Cheng, Wei
    Sun, Yan
    Lu, Haiyan
    Xiao, Fei
    Xu, Ruimin
    INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2020, 33 (03)
  • [49] Hybrid small-signal model parameter extraction of GaN HEMTs on Si and SiC substrates based on global optimization
    Jarndal, Anwar H.
    Hussein, Ahmed S.
    INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 2019, 29 (10)
  • [50] Extraction of small-signal model parameters of silicon mosfet for RF applications
    Goswami, A
    Agrawal, A
    Gupta, M
    Gupta, RS
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2000, 27 (05) : 352 - 358