Multimode-laser reflectometer with a multichannel wavelength detector and its application

被引：16
作者：
Funaba, T
Tanno, N
Ito, H
机构：
[1] YAMAGATA UNIV,GRAD PROGRAM HUMAN SENSING & FUNCT SENSOR ENGN,YONEZAWA,YAMAGATA 992,JAPAN
[2] TOHOKU UNIV,ELECT COMMUN RES INST,AOBA KU,SENDAI,MIYAGI 98077,JAPAN
来源：
APPLIED OPTICS | 1997年 / 36卷 / 34期
关键词：
multimode laser; reflectometer; multichannel wavelength detector; mapping; basic characteristics;
D O I：
10.1364/AO.36.008919
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A multimode-laser reflectometer that detects an interference spectrum by use of a multichannel wavelength detector was developed and its characteristics evaluated experimentally. A spatial resolution of 24 mu m and a maximum detectable length of 510 mu m were achieved. Thickness mapping of a coverglass was attempted as an application and was compared with an interference fringe between the surface and the back. Good results that reflected the tendency of an interference fringe were obtained. (C) 1997 Optical Society of America.
引用
收藏
页码：8919 / 8928
页数：10
相关论文
共 17 条
[1]   HIGH-RESOLUTION REFLECTOMETRY IN BIOLOGICAL TISSUES [J].
CLIVAZ, X ;
MARQUISWEIBLE, F ;
SALATHE, RP ;
NOVAK, RP ;
GILGEN, HH .
OPTICS LETTERS, 1992, 17 (01) :4-6
[2]   OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY IN SINGLE-MODE FIBER [J].
EICKHOFF, W ;
ULRICH, R .
APPLIED PHYSICS LETTERS, 1981, 39 (09) :693-695
[3]  
FAUNTAINE JJ, 1981, OPT LETT, V6, P405
[4]   NEURAL-NETWORK STEP-FREQUENCY FAULT LOCATOR [J].
FUJII, S ;
IIZUKA, K .
OPTICAL ENGINEERING, 1995, 34 (05) :1441-1449
[5]  
FUNABA T, 1995, 1995 INT LAS LIGHTW, P308
[6]  
HASHIMOTO M, 1992, J SPECTROSC SOC JPN, V41, P317
[7]   High-resolution reflectometry by optical multidigitized coherence [J].
Ichimura, T ;
Anndo, N ;
Funaba, T ;
Endo, S ;
Odagiri, Y ;
Tanno, N ;
Inaba, H .
OPTICAL REVIEW, 1996, 3 (01) :38-46
[8]   OPTICAL STEP FREQUENCY REFLECTOMETER [J].
IIZUKA, K ;
IMAI, Y ;
FREUNDORFER, AP ;
JAMES, R ;
WONG, R ;
FUJII, S .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (03) :932-936
[9]   OPTICAL COHERENCE DOMAIN REFLECTOMETRY BY SYNTHESIS OF COHERENCE FUNCTION WITH NONLINEARITY COMPENSATION IN FREQUENCY-MODULATION OF A LASER-DIODE [J].
KAMATANI, O ;
HOTATE, K .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1993, 11 (11) :1854-1862
[10]   Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer [J].
Kasaya, K ;
Yoshikuni, Y ;
Ishii, H .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1996, 8 (02) :251-253
12