Microstructural studies of Tl2Ba2Ca2Cu3Ox thin films on LaAlO3 and MgO substrates.

被引：5
|
作者：
Bramley, AP
Wilkinson, AJ
Jenkins, AP
Grovenor, CRM
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[2] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
来源：
JOURNAL OF SUPERCONDUCTIVITY | 1998年 / 11卷 / 01期
基金：
英国工程与自然科学研究理事会;
关键词：
EBSD; microstructure; superconductor; surface resistance; TBCCO;
D O I：
10.1023/A:1022685913672
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Tl(2)Ba2Ca(2)Cu(3)O(x) thin films have been fabricated on (001) LaAlO3 and (001) MgO substrates. Films grown on LaAlO3 have T-c=112K and R-s(80K, 10GHz)=0.2m Ohm, while films on MgO have T-c=117K and R-s(80K; 10GHz)=0.7m Ohm. The grain size and alignment of the Alms has been investigated using X-ray diffraction, Scanning Electron Microscopy and Electron Backscattered Diffraction. We show evidence for a markedly higher in-plane angular spread for films on MgO and believe that for films grown on this substrate the lowest achievable values of R-s are limited by disorder in the in-plane alignment of the TBCCO film caused by the large lattice mismatch between the materials.
引用
收藏
页码：71 / 72
页数：2
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