Epitaxial integration of (0001) BiFeO3 with (0001) GaN

被引:63
作者
Tian, W.
Vaithyanathan, V.
Schlom, D. G.
Zhan, Q.
Yang, S. Y.
Chu, Y. H.
Ramesh, R.
机构
[1] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
关键词
D O I
10.1063/1.2730580
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial growth of (0001)-oriented BiFeO3 thin films on the (0001) surface of GaN has been realized using intervening epitaxial (111) SrTiO3 /(100) TiO2 buffer layers. The epitaxial BiFeO3 thin films have two in-plane orientations: [11 (2) over bar0] BiFeO3 parallel to [11 (2) over bar0]GaN plus a twin variant related by a 180 degrees in-plane rotation. BiFeO3 shows an out-of-plane remanent polarization of similar to 90 mu C/cm(2), which is comparable to the remanent polarization of BiFeO3 prepared on (111) SrTiO3 single crystal substrates. The orientation of BiFeO3 realized on GaN provides the maximal out-of-plane polarization of BiFeO3, which is equivalent to a surface charge of 5 x 10(14) electrons/ cm(2). (c) 2007 American Institute of Physics.
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