Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

被引：1

作者：

Amemiya, K. ^{[1
]}

Miyawaki, J.

Abe, H.

Sako, E. O. ^{[1
]}

Sakamaki, M.

机构：

[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

来源：

14TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS14), PROCEEDINGS | 2009年 / 190卷

关键词：

X-RAY BEAMLINE; CIRCULAR-DICHROISM;

D O I：

10.1088/1742-6596/190/1/012108

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Recent progresses in the depth-resolved X-ray magnetic circular dichroism (XMCD) and X-ray absorption fine structure (XAFS) techniques are presented. The depth-resolved atomic and magnetic structures of Co films grown on Ru(0001) was investigated by using the depth-resolved XMCD and extended X-ray absorption fine structure EXAFS. The threedimensional magnetic structure of a micro-patterned Fe/Ni/Cu(100) film was studied by combining the depth-resolved XMCD with the X-ray microbeam. The technique was also applied to Co thin films covered with a relatively thick Mo overlayer, in order to demonstrate the possibility to investigate ex-situ samples with a protection layer.

引用

页数：12

共 18 条

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