The Effect of Substrate on the Properties of Non-volatile Ferroelectric P(VDF-TrFE)/P3HT Memory Devices

被引:11
作者
Chu, Xiao [1 ]
Kang, Jia-Qian [2 ]
Hong, Ya [1 ]
Zhu, Guo-Dong [3 ]
Yan, Shou-Ke [1 ,4 ]
Wang, Xue-Yun [2 ]
Sun, Xiao-Li [1 ]
机构
[1] Beijing Univ Chem Technol, State Key Lab Chem Resource Engn, Beijing 100029, Peoples R China
[2] Beijing Inst Technol, Sch Aerosp Engn, Beijing 100081, Peoples R China
[3] Fudan Univ, Dept Mat Sci, Shanghai 200433, Peoples R China
[4] Qingdao Univ Sci & Technol, Key Lab Rubber Plast, Minist Educ, Shandong Prov Key Lab Rubber Plast, Qingdao 266042, Peoples R China
基金
中国国家自然科学基金;
关键词
P(VDF-TrFE); P3HT; Graphene; Memory devices; Ferroelectric properties; POLY(VINYLIDENE FLUORIDE); THIN-FILM; POLYMER MEMORY; PHASE; GRAPHENE; CRYSTALLIZATION; PERFORMANCE; CRYSTALS; LAYER; ORIENTATION;
D O I
10.1007/s10118-022-2733-1
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Ferroelectric poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE))/semiconducting poly(3-hexyl thiophene) (P3HT) blend systems have drawn great attention with their potential use for electronic applications, particularly non-volatile memory devices. It is essential to grasp a full understanding of the crystallization habits of the two polymers on different substrates for purposeful control of the structures of the blend and therefore the properties of the devices. Here, the effects of structure and morphology of the blend films generated at different substrate surfaces on the ferroelectric and switching properties of related devices are reported. It is identified that P(VDF-TrFE)/P3HT blend films prepared on graphene substrate show not only an obvious optimization in the ferroelectric behavior of P(VDF-TrFE), but also an enhancement of the charge transport within P3HT domains. By employing sandwich structure constructed by silver electrode and P3HT/P(VDF-TrFE) blend film on graphene substrate, high-performance ferroelectric memory devices have been obtained, which exhibit a great electrical switching behavior with high ON/OFF ratio of about 1000 and low coercive voltage of approximately 5 V. These findings provide useful guidance for fabricating high-performance ferroelectric memory devices.
引用
收藏
页码:692 / 699
页数:8
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