Electron cyclotron resonance plasma etching of GaSb-based alloys

被引:1
|
作者
Ahmad, RU [1 ]
Nagy, G
Osgood, RM
Turner, GW
Manfra, MJ
Chludzinski, JW
机构
[1] Columbia Univ, Microelect Sci Labs, New York, NY 10027 USA
[2] MIT, Lincoln Lab, Lexington, MA 02173 USA
关键词
D O I
10.1063/1.1289058
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron cyclotron resonance plasma etching is used to fabricate submicrometer-scale GaInAsSb/AlGaAsSb multiple-quantum-well structures. Smooth and anisotropic features at low substrate bias were obtained under appropriate conditions. The etch quality was investigated with photoluminescence spectroscopy; luminescence data from the etched features agree well with a model that assumes a low-damage etching process. (C) 2000 American Institute of Physics. [S0003-6951(00)03633-0].
引用
收藏
页码:1008 / 1010
页数:3
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