Electrical capacitance volume tomography with high contrast dielectrics using a cuboid sensor geometry

被引:21
作者
Nurge, Mark A. [1 ]
机构
[1] NASA, Kennedy Space Ctr, Kennedy Space Ctr, FL 32899 USA
关键词
electrical capacitance volume tomography; electrical capacitance tomography; image reconstruction; high contrast dielectrics; iterative algorithm; inverse problem; self-capacitance;
D O I
10.1088/0957-0233/18/5/042
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An electrical capacitance volume tomography system has been created for use with a new image reconstruction algorithm capable of imaging high contrast dielectric distributions. The electrode geometry consists of two 4 x 4 parallel planes of copper conductors connected through custom built switch electronics to a commercially available capacitance to digital converter. Typical electrical capacitance tomography ( ECT) systems rely solely on mutual capacitance readings to reconstruct images of dielectric distributions. This paper presents a method of reconstructing images of high contrast dielectric materials using only the self-capacitance measurements. By constraining the unknown dielectric material to one of two values, the inverse problem is no longer ill-determined. Resolution becomes limited only by the accuracy and resolution of the measurement circuitry. Images were reconstructed using this method with both synthetic and real data acquired using an aluminium structure inserted at different positions within the sensing region. Comparisons with standard two-dimensional ECT systems highlight the capabilities and limitations of the electronics and reconstruction algorithm.
引用
收藏
页码:1511 / 1520
页数:10
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