Iterative reconstruction of in-line electron holoarams

被引:4
作者
Arocena, JF
Rothwell, TA
Shegelski, MRA
机构
[1] Univ Toronto, Dept Astron & Astrophys, Toronto, ON M5S 3H8, Canada
[2] Univ No British Columbia, Dept Phys, Prince George, BC V2N 4Z9, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
electron microscopy; reconstruction; LEEPS; electron holography;
D O I
10.1016/j.micron.2004.06.005
中图分类号
TH742 [显微镜];
学科分类号
摘要
In low energy electron point source (LEEPS) microscopy, electrons emerge from a point source, propagate as spherical waves, and arrive at a screen. Some electrons scatter off an object, i.e. a cluster of atoms, placed between the source and the screen; others arrive at the screen without scattering. The interference pattern on the screen, an electron hologram. is used to reconstruct the object by calculating and analyzing a function K((r) over right arrow) in the region occupied by the object. We present an iterative method that uses the original reconstruction K-o((r) over right arrow) to determine the atomic configuration of the object. No knowledge of the object, except for the vicinity in which the object is located, is used in the iterative scheme. In particular, no knowledge of the atomic structure is used. The method uses K-o((r) over right arrow) to make a test object that in turn gives another reconstruction K-1((r) over right arrow); K-o((r) over right arrow) and K-2((r) over right arrow) are used to modify the test object and obtain K,(-r). The iteration is repeated until it converges on a final object that gives a reconstruction K-f((r) over right arrow) that is very similar to K-o((r) over right arrow). The final object gives an atomic structure that is close to the, atomic structure of the original object. Results for several idealized objects are presented and discussed. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:23 / 30
页数:8
相关论文
共 10 条
[1]   Amplitude recovery in Fresnel projection microscopy [J].
Bleloch, AL ;
Howie, A ;
James, EM .
APPLIED SURFACE SCIENCE, 1997, 111 :180-184
[2]  
CARBIERI A, 1998, COMMUNICATION
[3]   Optimization of the low energy electron point source microscope:: imaging of macromolecules [J].
Gölzhäuser, A ;
Völkel, B ;
Grunze, M ;
Kreuzer, HJ .
MICRON, 2002, 33 (03) :241-255
[4]   Nanoscale patterning of self-assembled monolayers with electrons [J].
Gölzhäuser, A ;
Geyer, W ;
Stadler, V ;
Eck, W ;
Grunze, M ;
Edinger, K ;
Weimann, T ;
Hinze, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :3414-3418
[5]  
Gooch R, 1996, ASTR SOC P, V101, P80
[6]   Wavefront reconstruction for in-line holograms formed by pure amplitude objects [J].
Huang, XMH ;
Zuo, JM ;
Spence, JCH .
APPLIED SURFACE SCIENCE, 1999, 148 (3-4) :229-234
[7]   THEORY OF THE POINT-SOURCE ELECTRON-MICROSCOPE [J].
KREUZER, HJ ;
NAKAMURA, K ;
WIERZBICKI, A ;
FINK, HW ;
SCHMID, H .
ULTRAMICROSCOPY, 1992, 45 (3-4) :381-403
[8]   Tomographic reconstruction of multiple in-line electron holograms of realistic objects [J].
Rothwell, TA ;
Shegelski, MRA .
MICRON, 2005, 36 (01) :31-45
[9]   Tracking particles in four dimensions with in-line holographic microscopy [J].
Xu, W ;
Jericho, MH ;
Kreuzer, HJ ;
Meinertzhagen, IA .
OPTICS LETTERS, 2003, 28 (03) :164-166
[10]   Digital in-line holography for biological applications [J].
Xu, WB ;
Jericho, MH ;
Meinertzhagen, IA ;
Kreuzer, HJ .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2001, 98 (20) :11301-11305