On the choice of tuning parameters for use with Robust GCV, Modified GCV and the Discrepancy Principle in the inversion of ARXPS data

被引:4
作者
Peykov, D. [1 ]
Paynter, R. W. [2 ]
机构
[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[2] INRS Energie Mat Telecommun, Varennes, PQ J3X 1S2, Canada
关键词
Angle-resolved X-ray photoelectron spectroscopy; Depth profile; Tikhonov regularization; Matrix model; GENERALIZED CROSS-VALIDATION; DEPTH PROFILES; XPS; REGULARIZATION; AES;
D O I
10.1016/j.elspec.2014.09.011
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Composition depth profiles were extracted from simulated ARXPS data using regularization, with the regularization parameter determined by three different methods (Robust GCV, Modified GCV, and the Discrepancy Principle) that require tuning parameters. For each method, the optimal tuning parameter was determined for two input profile shapes, three Tikhonov regulators (0th, 1st, and 2nd order), and data noise ranging from 1% to 9%. Although universally applicable optimal tuning parameters were not identified, it was found that certain values could consistently produce acceptable results for the input profiles used in this study. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:93 / 101
页数:9
相关论文
共 21 条
[1]  
Babanov YA, 2008, J STRUCT CHEM+, V49, pS165
[2]   Comparing parameter choice methods for regularization of ill-posed problems [J].
Bauer, Frank ;
Lukas, Mark A. .
MATHEMATICS AND COMPUTERS IN SIMULATION, 2011, 81 (09) :1795-1841
[3]   Confidence intervals for nonparametric curve estimates: Toward more uniform pointwise coverage [J].
Cummins, DJ ;
Filloon, TG ;
Nychka, D .
JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION, 2001, 96 (453) :233-246
[4]   ANGLE-RESOLVED XPS AND AES - DEPTH-RESOLUTION LIMITS AND A GENERAL COMPARISON OF PROPERTIES OF DEPTH-PROFILE RECONSTRUCTION METHODS [J].
CUMPSON, PJ .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 73 (01) :25-52
[5]   GENERALIZED CROSS-VALIDATION AS A METHOD FOR CHOOSING A GOOD RIDGE PARAMETER [J].
GOLUB, GH ;
HEATH, M ;
WAHBA, G .
TECHNOMETRICS, 1979, 21 (02) :215-223
[6]  
Hansen P. C., 1998, RANK DEFICIENT DISCR
[7]   THE DETERMINATION OF UNCERTAINTIES IN QUANTITATIVE XPS AES AND ITS IMPACT ON DATA ACQUISITION STRATEGY [J].
HARRISON, K ;
HAZELL, LB .
SURFACE AND INTERFACE ANALYSIS, 1992, 18 (05) :368-376
[8]   Robust generalized cross-validation for choosing the regularization parameter [J].
Lukas, Mark A. .
INVERSE PROBLEMS, 2006, 22 (05) :1883-1902
[9]   Encoding of stoichiometric constraints in the composition depth profile reconstruction from angle resolved X-ray photoelectron spectroscopy data [J].
Macak, Karol .
SURFACE AND INTERFACE ANALYSIS, 2011, 43 (13) :1581-1604
[10]   Effect of binning on the inversion of ARXPS data [J].
Paynter, R. W. .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2013, 187 :53-60