Progress in far-infrared detection technology

被引:2
作者
Zhou, YD [1 ]
Becker, CR [1 ]
Ashokan, R [1 ]
Selamet, Y [1 ]
Chang, Y [1 ]
Boreiko, RT [1 ]
Betz, AL [1 ]
Sivananthan, S [1 ]
机构
[1] Univ Illinois, Microphys Lab, Chicago, IL 60607 USA
来源
MATERIALS FOR INFRARED DETECTORS II | 2002年 / 4795卷
关键词
far-infrared; HgCdTe; molecular beam epitaxy(MBE); II-VI superlattice; detectors; arrays;
D O I
10.1117/12.452270
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
II-VI intrinsic very long wavelength infrared (VLWIR, lambda(c) similar to 20 to 50 mum) materials, HgCdTe alloys as well as HgCdTe/CdTe superlattices, were grown by molecular beam epitaxy (MBE). The layers were characterized by means of X-ray diffraction, conventional Fourier transform infrared spectroscopy, Hall effect measurements and transmittance electron microscopy (TEM). Photoconductor devices were processed and their spectral response was also measured to demonstrate their applicability in the VLWIR region.
引用
收藏
页码:121 / 128
页数:8
相关论文
共 4 条
[1]   Band structure and its temperature dependence for type-III HgTe/Hg1-xCdxTe superlattices and their semimetal constituent [J].
Becker, CR ;
Latussek, V ;
Pfeuffer-Jeschke, A ;
Landwehr, G ;
Molenkamp, LW .
PHYSICAL REVIEW B, 2000, 62 (15) :10353-10363
[2]   Space applications for HgCdTe at FIR wavelengths between 50-150 μm [J].
Betz, AL ;
Boreiko, RT .
MATERIALS FOR INFRARED DETECTORS, 2001, 4454 :1-9
[3]  
BETZ AL, 2002, P NASA
[4]   Latest results of HgCdTe 2048 x 2048 and silicon focal plane arrays [J].
Cabelli, CA ;
Cooper, DE ;
Haas, A ;
Kozlowski, LJ ;
Bostrup, G ;
Chen, AC ;
Blackwell, JD ;
Montroy, JT ;
Vural, K ;
Kleinhans, WE ;
Hodapp, KW ;
Hall, D .
INFRARED DETECTORS AND FOCAL PLANE ARRAYS VI, 2000, 4028 :331-342