Dynamic testing of ADCs using wavelet transforms

被引：10
|
作者：
Yamaguchi, T [1 ]
机构：
[1] ADVANTEST Labs Ltd, Aoba Ku, Sendai, Miyagi 98931, Japan
来源：
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年
关键词：
D O I：
10.1109/TEST.1997.639640
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper introduces a new method for evaluating non-idealities in ADCs using wavelet transforms. Compared with conventional testing methods, this method can shorten the test rime and improve test quality during production testing of ADCs.
引用
收藏
页码：379 / 388
页数：10
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