Interferometric observation of microlensing events

Interferometric observations of microlensing events have the potential to provide unique constraints on the physical properties of the lensing systems. In this work, we first present a formalism that closely combines interferometric and microlensing observable quantities, which lead us to define an original microlensing (u, v) plane. We run simulations of long-baseline interferometric observations and photometric light curves to decide which observational strategy is required to obtain a precise measurement on vector Einstein radius. We finally perform a detailed analysis of the expected number of targets in the light of new microlensing surveys (2011+) which currently deliver 2000 alerts per year. We find that a few events are already at reach of long-baseline interferometers (CHARA, VLTI), and a rate of about six events per year is expected with a limiting magnitude of K a parts per thousand integral 10. This number would increase by an order of magnitude by raising it to K a parts per thousand integral 11. We thus expect that a new route for characterizing microlensing events will be opened by the upcoming generations of interferometers.