On the Accurate Full Characterization of Septum Polarizers Through Simple Amplitude Measurements in Back-to-Back Configuration

被引：12

作者：

Cano, Juan Luis ^{[1
]}

Mediavilla, Angel ^{[1
]}

机构：

[1] Univ Cantabria, Dept Ingn Comunicac, Santander 39005, Spain

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2021年 / 69卷 / 01期

关键词：

Microwave measurement; Loss measurement; Microwave theory and techniques; Extraterrestrial measurements; Polarization; Calibration; Microwave components; microwave measurement techniques; septum-polarizers (SPs); waveguide devices; BAND;

D O I：

10.1109/TMTT.2020.3020639

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This article introduces an easy and accurate technique for the full characterization of septum polarizers (SPs) in back-to-back configuration through standard amplitude/power measurements at the rectangular waveguide ports. The proposed calibration algorithm, based on the use of two simple waveguide sections, along with the developed mathematical formulation, allows the complete extraction of the relevant SP parameters: return loss, isolation, cross-coupling (XP) or axial ratio (AR), and copolarization losses (CP). The methodology has been successfully validated for two different designs at Ku-band.

引用

页码：179 / 188

页数：10

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