High electron mobility in thin films formed via supersonic impact deposition of nanocrystals synthesized in nonthermal plasmas

被引:85
作者
Thimsen, Elijah [1 ]
Johnson, Melissa [2 ]
Zhang, Xin [2 ]
Wagner, Andrew J. [2 ]
Mkhoyan, K. Andre [2 ]
Kortshagen, Uwe R. [3 ]
Aydil, Eray S. [2 ]
机构
[1] Washington Univ, Dept Energy Environm & Chem Engn, St Louis, MO 63130 USA
[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[3] Univ Minnesota, Dept Mech Engn, Minneapolis, MN 55455 USA
基金
美国国家科学基金会;
关键词
ATOMIC LAYER DEPOSITION; QUANTUM DOTS; ZINC OXIDE; ZNO; TRANSPORT; HETEROSTRUCTURES; TRANSISTORS; DIFFUSION; SILICON; SOLIDS;
D O I
10.1038/ncomms6822
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Thin films comprising semiconductor nanocrystals are emerging for applications in electronic and optoelectronic devices including light emitting diodes and solar cells. Achieving high charge carrier mobility in these films requires the identification and elimination of electronic traps on the nanocrystal surfaces. Herein, we show that in films comprising ZnO nanocrystals, an electron acceptor trap related to the presence of OH on the surface limits the conductivity. ZnO nanocrystal films were synthesized using a nonthermal plasma from diethyl zinc and oxygen and deposited by inertial impaction onto a variety of substrates. Surprisingly, coating the ZnO nanocrystals with a few nanometres of Al2O3 using atomic layer deposition decreased the film resistivity by seven orders of magnitude to values as low as 0.12 Omega cm. Electron mobility as high as 3 cm(2)V(-1) s(-1) was observed in films comprising annealed ZnO nanocrystals coated with Al2O3.
引用
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页数:9
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