Bonding techniques for hybrid active pixel sensors (HAPS)

被引:24
作者
Bigas, M. [1 ]
Cabruja, E. [1 ]
Lozano, M. [1 ]
机构
[1] CSIC, CNM IMB, Ctr Nacl Microelect, Barcelona 08193, Spain
关键词
flip chip; bumping; 2D packaging; 3D packaging; solder bumps; hybrid active pixel sensors (HAPS);
D O I
10.1016/j.nima.2007.01.176
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A hybrid active pixel sensor (HAPS) consists of an array of sensing elements which is connected to an electronic read-out unit. The most used way to connect these two different devices is bump bonding. This interconnection technique is very suitable for these systems because it allows a very fine pitch and a high number of I/Os. However, there are other interconnection techniques available such as direct bonding. This paper, as a continuation of a review [M. Lozano, E. Cabruja, A. Collado, J. Santander, M. Ullan, Nucl. Instr. and Meth. A 473 (1-2) (2001) 95-101] published in 2001, presents an update of the different advanced bonding techniques available for manufacturing a hybrid active pixel detector. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:392 / 400
页数:9
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