Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

被引:73
作者
Cockins, Lynda [1 ]
Miyahara, Yoichi [1 ]
Bennett, Steven D. [1 ]
Clerk, Aashish A. [1 ]
Studenikin, Sergei [2 ]
Poole, Philip [2 ]
Sachrajda, Andrew [2 ]
Grutter, Peter [1 ]
机构
[1] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada
[2] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
nanoelectronics; single-electron charging; shell structure; electrostatic force microscopy; COULOMB-BLOCKADE; SPECTROSCOPY; STATES;
D O I
10.1073/pnas.0912716107
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Strong confinement of charges in few-electron systems such as in atoms, molecules, and quantum dots leads to a spectrum of discrete energy levels often shared by several degenerate states. Because the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important. We show how electrostatic force detection using atomic force microscopy reveals the electronic structure of individual and coupled self-assembled quantum dots. An electron addition spectrum results from a change in cantilever resonance frequency and dissipation when an electron tunnels on/off a dot. The spectra show clear level degeneracies in isolated quantum dots, supported by the quantitative measurement of predicted temperature-dependent shifts of Coulomb blockade peaks. Scanning the surface shows that several quantum dots may reside on what topographically appears to be just one. Relative coupling strengths can be estimated from these images of grouped coupled dots.
引用
收藏
页码:9496 / 9501
页数:6
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