Electrical Analogy to an Atomic Force Microscope

被引：0

作者：

Kucera, Ondrej ^{[1
,2
]}

机构：

[1] Acad Sci Czech Republic, Inst Photon & Elect, CR-18251 Prague 8, Czech Republic

[2] Czech Tech Univ, Dept Circ Theory, Fac Elect Engn, Prague 16627 6, Czech Republic

来源：

RADIOENGINEERING | 2010年 / 19卷 / 01期

关键词：

Atomic Force Microscopy; electrical mechanical analogs; circuit theory; NOISE; CANTILEVER; SYSTEMS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.

引用

收藏

页码：168 / 171

页数：4

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