Reliability Study on Smart Electricity Meter

被引:0
作者
Wang Xiaoming [1 ]
机构
[1] Natl Univ Def Technol, Sch Mechatron Engn & Automat, Changsha, Hunan, Peoples R China
来源
2016 INTERNATIONAL CONFERENCE ON SYSTEM RELIABILITY AND SCIENCE (ICSRS 2016) | 2016年
关键词
smart electricity meter; reliability; reliability prediction; component stress method; accelerated test;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to evaluate the performance of smart electricity meter (SEM), this paper studies the reliability of the SEM. We introduce the indication of the reliability and analyze the standards and documents relevant to SEM. Then, we use the component stress method to predict the reliability of SEM based on the study of SEM. Finally, through an example, we obtain the expected failure rate of SEM from the kind of DDZY102C-Z produced by the Wasion Group through the method proposed. The result of the predicted reliability of the SEM is 5640.43 FIT (failure in time: 10-9Failures/h). Furthermore, in order to validate the proposed method, accelerated test is taken to assess the reliability of the smart electricity meter, and the experimental results show that the predicted reliability of the SEM has a high credibility.
引用
收藏
页码:162 / 166
页数:5
相关论文
共 32 条
[1]  
[Anonymous], 2006, Telcordia SR-332 Issue 2
[2]  
[Anonymous], 1995, MILHDBK217F US DEP D
[3]  
[Anonymous], 2019, HUMAN RELIABILITY PR
[4]  
Fan Xiaofei, 2015, Electrical Measurement and Instrumentation, V52, P15
[5]  
France Airbus, 2004, FIDES GUIDE 2004 ISS
[6]  
General Administration of Quality Supervision Inspection and Quarantine of the People's Republic of China, 2002, JJF10942002 GEN ADM
[7]  
General Administration of Quality Supervision Inspection and Quarantine of the People's Republic of China, 2006, JJF10242006 GEN ADM
[8]  
IEEE Standards Coordinating Committee, 2006, IEC62059412006 IEEE
[9]  
International Electrotechnical Commission, 2006, IECTR623802004
[10]   A comparison of electronic-reliability prediction models [J].
Jones, J ;
Hayes, J .
IEEE TRANSACTIONS ON RELIABILITY, 1999, 48 (02) :127-134