Combinatorial Effects of Solvent Type, Thermal Annealing and Al Electrode on the Morphology of P3HT:PCBM Layer

被引：1

作者：

Lee, Hyun Hwi ^{[1
]}

Shin, Tae Joo ^{[1
,3
]}

Kim, Hyo Jung ^{[2
]}

机构：

[1] POSTECH, Pohang Accelerator Lab, Pohang 790784, South Korea

[2] Pusan Natl Univ, Coll Engn, Dept Organ Mat Sci & Engn, Busan 609735, South Korea

[3] UNIST, UNIST Cent Res Facil, Ulsan 689798, South Korea

来源：

SCIENCE OF ADVANCED MATERIALS | 2016年 / 8卷 / 03期

基金：

新加坡国家研究基金会;

关键词：

Mixed Solvent; P3HT:PCBM; Al Metal; Annealing; X-ray Reflectivity; Small Angle X-ray Scattering; POLYMER; FULLERENE; PERFORMANCE; POLY(3-HEXYLTHIOPHENE); POLYTHIOPHENE; INTERFACE; FILMS;

D O I：

10.1166/sam.2016.2516

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Poly(3-hexylthiophene):phenyl-C61-butyric acid methyl ester (P3HT:PCBM) films were spin-cast using either pure chlorobenzene as the solvent or a chlorobenzene:dichlorobenzene solvent mixture. Compared to films fabricated using pure chlorobenzene, those prepared using the mixed solvent showed better crystallinity of the P3HT domains and a higher initial tensile strain. Thermal annealing relieved the tensile strain and increasing the domain crystallinity. The films spin-cast using the solvent mixture exhibited minimal Al atom diffusion into the P3HT:PCBM layer during thermal annealing. The presence of an Al layer enhanced the grazing incidence small angle X-ray scattering contrast between the P3HT and PCBM domains at the Al layer interface.

引用

页码：618 / 621

页数：4

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