HDA-level ESD testing of giant magnetoresistive (GMR) recording heads

被引:1
|
作者
Nordin, D [1 ]
机构
[1] Quantum Corp, Milpitas, CA 95035 USA
关键词
D O I
10.1109/EOSESD.2000.890047
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The drive-level electrostatic discharge (ESD) behavior of a recent model of a desktop disk drive is discussed. ESD events are simulated up to 30kV using an ESD gun (IEC-801), The drives were evaluated at the final assembly level, The HDAs were equipped with GMR heads and single ended preamplifiers. In a manner similar to evaluations of head stack assemblies iii, the head disk assemblies were stressed using an ESD gun at various strategic points of the drive, The printed circuit boards were in place when directing ESD events to the base and removed to address the motor pins (Figure 1), A quasi-static tester (QST) was employed to evaluate the GMR head condition as described by the signal amplitude, resistance and pinned layer orientation. The QST was able to evaluate the GMR condition without any disassembly of the drive. Analyses of the GMR condition before and after ESD stress are discussed.
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页码:205 / 210
页数:4
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